Foundations of Measurement, Vol. 2: Geometrical, Threshold and Probabilistic Representations - Hardcover

Patrick Suppes; David H. Krantz; R. Duncan Luce; Amos Tversky

Hardcover

ISBN 10: 0124254020 ISBN 13: 9780124254022

Publisher: Academic Press, 1989

Synopsis

Foundations of Measurement offers the most coherently organized treatment of the topics and issues central to measurement. Much of the research involved has been scattered over several decades and a multitude of journals--available in many instances only to specialties. With the publication of Volumes two and three of this important work, Foundations of Measurement is the most comprehensive presentation in the area of measurement.

About this title

About the Author

David H. Krantz is affiliated with Columbia University; R. Duncan Luce with the University of California, Irvine, and Patrick Suppes with Stanford University. Amos Tversky is deceased.

Review

This serious volume lends a timely legitimacy and maturity to the enriched classes of models that are being developed by the methodologists, but which will be increasingly employed by members of the broader psychological measurement community.
--APPLIED PSYCHOLOGICAL MEASUREMENT
[The following quote should be used only when advertising both volumes II and III together]
The monumental finished work of more than 1,400 pages (volumes I, II, and III) is a tribute to its authors' perserverance as well as being a cornucopia of measurement theory.
--JOURNAL OF THE AMERICAN STATISTICAL ASSOCIATION

Edition details

• Publisher: Academic Press
• Publication date: 1989
• Language: English
• ISBN 10: 0124254020
• ISBN 13: 9780124254022
• Binding: Hardcover
• Edition number: 1
• Number of pages: 493