Optical Characterization of Real Surfaces and Films: Advances in Research and Development (Volume 19) (Physics of Thin Films, Volume 19) - Hardcover
Synopsis
This new volume of the highly respected Physics of Thin Films Serial discusses inhomogeneity in real films and surfaces. The volume, guest-edited by K. Vedam, follows the growth of thin films both from the surface of the substrate, and from the atomic level, layer by layer. The text features coverage of Real-Time Spectroscopic Ellipsometry (RTSE) and Reflectance Anisotropy (RA), two major breakthrough optical techniques used to characterize real time and insitu films and surfaces. In six insightful chapters, the contributors assess the impact of these techniques, their strengths and limitations, and their potential for further development.
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Physics of Thin Films: Optical Characterizations of Real Surfaces and Films
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Hardcover. Condition: Bon. Ancien livre de bibliothèque. Salissures sur la tranche. Edition 1994. Tome 19. Ammareal reverse jusqu'à 15% du prix net de cet article à des organisations caritatives. ENGLISH DESCRIPTION Book Condition: Used, Good. Former library book. Stains on the edge. Edition 1994. Volume 19. Ammareal gives back up to 15% of this item's net price to charity organizations. Seller Inventory # D-599-166
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Physics of Thin Films: Optical Characterization of Real Surfaces and Films (Volume 19)
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Condition: Good. Volume 19. This is an ex-library book and may have the usual library/used-book markings inside.This book has hardback covers. Clean from markings In good all round condition. No dust jacket. Please note the Image in this listing is a stock photo and may not match the covers of the actual item,700grams, ISBN:0125330197. Seller Inventory # 9701484
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Optical Characterization of Real Surfaces and Films. With many figures
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Academic Press, San Diego, 1994
ISBN 10: 0125330197
ISBN 13: 9780125330190
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OSkaibd. Condition: Sehr gut. gr8 OSkaibd. en Naturwissenschaften, Optik, Physik (Physics of Thin Films. Advances in Research and Development. Vol. 19); XV pp., 328 pp. Seller Inventory # 3085
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Optical Characterization of Real Surfaces and Films: Advances in Research and Development (Volume 19) (Physics of Thin Films, Volume 19)
Seller: Mispah books, Redhill, SURRE, United Kingdom
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Hardcover. Condition: Good. Good. Dust Jacket NOT present. CD WILL BE MISSING. . SHIPS FROM MULTIPLE LOCATIONS. book. Seller Inventory # ERICA82901253301973
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