Test System Design: A Systematic Approach

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9780130272607: Test System Design: A Systematic Approach
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The rapid growth of high-speed semiconductor and communication technologies has helped make phase-locked loops (PLLs) an essential part of memories, microprocessors, radio-frequency (RF) transceivers, broadband data communication systems and other growing fields. This book collects together important writing on PLL into a comprehensive look at PLL devices, circuits and architectures. The text's five tutorials and 83 key papers provide a readable foundation in phase-locked systems. Analogue and digital circuit designers will glean a wide range of practical information from the book's tutorials dealing with devices, delay-locked loops (DLLs), fractional-N synthesizers, bang-bang PLLs and simulation of phase noise and jitter. In-depth discussions of passive devices such as inductors, transformers and varactors are also included.

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From the Back Cover:

  • The only expert guide to designing and implementing custom test systems
  • Best practices for the entire lifecycle: planning through upgrades
  • Maximizing accuracy, reliability, and usability(and protecting against obsolescence

    More and more engineers now face the challenges of electronic testing(and those challenges are becoming more complex each year. In Test System Design: A Systematic Approach, three expert testing professionals offers start-to-finish best practices for designing, developing, and implementing custom test systems. Ideal for both engineers who are creating test systems and those contracting the responsibility to third parties, this book covers the entire system lifecycle, from planning to upgrades, and beyond.

    • Designing, developing, and implementing more effective test systems(from start to finish
    • Protecting against obsolescence through planned upgrades and open standards
    • Simplifying development, minimizing risk, and maximizing accuracy and reliability
    • Building systems that fit the skills of your operators
    • Expert implementation: interfaces, cabling, switch panels, electrical safety, racking, temperature control, and more

    Discover proven techniques for evaluating your testing requirements, eliminating redundant tests, and determining exactly which equipment you really need. Compare your options for sourcing test equipment, and learn how to maximize the value of every supplier relationship. Learn better solutions for documenting your test systems, training your operators, streamlining your maintenance programs, and more. No matter what your testing challenges are, Test System Design is your comprehensive resource for achieving them faster and more cost effectively.

    About the Author:

    CHRISTINE TURSKY is Technology Training Manager for Agilent Technologies' (formerly Hewlett-Packard Company) Advanced Networks Division. She has 9 years of experience in engineering, business, and marketing at Agilent's Test and Measurement Organisation (TMO) and is Assistant Dean at the University of Melbourne Faculty of Engineering. RODNEY GORDON, also of Agilent Technologies' TMO Australia group, has over 20 years of engineering and business experience with defense accounts and in the defense industry. SCOTT COWIE is also part of TMO Australia and has 15 years of experience at HP, Agilent, and in the defense industry. He specializes in designing test systems for Agilent customers. Gordon and Cowie recently founded SouthTech Systems, an engineering company specializing in system design and integration.

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    Other Popular Editions of the Same Title

    9780137053933: Test System Design: A Systematic Approach (paperback)

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    ISBN 10:  0137053932 ISBN 13:  9780137053933
    Publisher: Prentice Hall, 2000

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    Tursky, Christine, Gordon, Rodney, Cowie
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    Tursky, Christine; Gordon, Rodney and Cowie, Scott
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