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Modern Measurement: Theory, Principles, and Applications of Mental Appraisal (2nd Edition) - Softcover

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9780137010257: Modern Measurement: Theory, Principles, and Applications of Mental Appraisal (2nd Edition)

Synopsis

Modern Measurement: Theory, Principles, and Applications of Mental Appraisal presents a wide array of information on diverse but fundamental aspects of test theory and its application to practical problems in mental measurement for the advanced student and measurement professional. In general, these ideas can be classified under measurement science. The chapters build from foundations of mental assessment, beginning with a description of cognitive appraisal, moving through classical measurement theory, reliability, scaling, test and item construction, generalizability, theory, item response theory (IRT), and on to item analysis, test equating and linking, and special issues of test administration, such as computer-assisted testing and computer-adaptive testing.

 

Written for students and teachers alike, this book is a must have for anyone who will be involved in measuring students successes. Readers will find the book written in a very accessible language that helps them understand the content. Modern Measurement by Steven J. Osterlind is a must have for students that need to understand measurement.

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About the Author

Dr. Steven J. Osterlind is Professor of Measurement and Statistics and Director of Educational Psychology program, University of Missouri-Columbia. Dr. Osterlind s expertise is in psychological assessment, including tests and measurement, statistics, psychometric methods and test development. He received his doctoral degree in 1976 in Educational Psychology (Measurement & Statistics) from the University of Southern California. In 1979, he was an American Scholar s Fellow at Yale University. At the University of Missouri he teaches graduate-level courses in multivariate statistics, analysis of variance, regression, general linear modeling, and psychometric methods. Additionally, he teaches seminar courses on specialized topics, including Item Response Theory and Computer Applications of Testing. He has worked on numerous national testing programs, including serving as statistician for NAEP (National Assessment of Educational Progress). In licensing and certification, he has worked with dozens of professional associations and organizations on their assessment programs. Dr. Osterlind has authored five books, the most recent of which is a major textbook titled Modern Measurement: Theory, Principles, and Application of Mental Appraisal; and, he has written more than 60 articles, book chapters, and other research reports in assessment. Additionally, he has authored more than 20 tests. He is principle author of College Basic Academic Subjects Examination (C-BASE), a test of collegiate achievement test currently adopted by more than 100 universities across the nation.

From the Back Cover

Modern Measurement: Theory, Principles, and Applications of Mental Appraisal presents a wide array of information on diverse but fundamental aspects of test theory and its application to practical problems in mental measurement for the advanced student and measurement professional. In general, these ideas can be classified under measurement science. The chapters build from foundations of mental assessment, beginning with a description of cognitive appraisal, moving through classical measurement theory, reliability, scaling, test and item construction, generalizability, theory, item response theory (IRT), and on to item analysis, test equating and linking, and special issues of test administration, such as computer-assisted testing and computer-adaptive testing.

 

Written for students and teachers alike, this book is a must have for anyone who will be involved in measuring students successes. Readers will find the book written in a very accessible language that helps them understand the content. Modern Measurement by Steven J. Osterlind is a must have for students that need to understand measurement.

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Publisher: Prentice Hall, 2005
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