The second volume in this comprehensive two-volume series provides information, procedures, tests and illustrations helping engineers analyze time-to-failure data to ensure greater reliability in the products they design. Volume II includes up-to-date information on Accept-Reject tests, the Sequential Probability Radio Test, Bayesian MTBF and Reliability Demonstration Tests, as well as some very important accelerated tests including Arrhenius, Eyriing, Bazovsky, Inverse Power Law and many others. It also offers sections on reliability growth monitoring techniques and property testing methods for establishing MTBF or reliability with the desired accuracy and confidence level.
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Covers quality testing of parts, products and systems for reliability over the expected life cycle of the product for advanced students and professionals in a broad range of industries.
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Book Description Prentice Hall, 1994. Hardcover. Book Condition: New. Never used!. Bookseller Inventory # P110137723695
Book Description Prentice Hall, 1994. Hardcover. Book Condition: New. book. Bookseller Inventory # M0137723695