This comprehensive two-volume set provides a wealth of information, procedures, tests, and illustrations helping engineers analyze time-to-failure data to ensure greater reliability in the products they design. Key features cover the determination of the MTBF, failure rate, and reliability of components and equipment during their useful life; innovative methods of tests of comparison for Weibull distributed data; and the unique "Suspended Items Testing" technique. The author is a renowned authority in his field. 6 x 9.
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The first volume in a comprehensive two volume series provides a wealth of information, procedures, tests, and illustrations helping engineers analyze time-to-failure data to ensure greater reliability in the products they design. Volume I delivers must-have information on a variety of distributions including Chi-Square, Exponential, Normal, Lognormal, Weibull, Gamma, and others. Coverage goes on to include vital testing methods and procedures such as tests of comparison for the Weibull Distribution, a step-by-step method for goodness-of-fit analysis, sudden death testing, and more. An ideal reference for reliability, product assurance, and test engineers.
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