Scanning Force Microscopy: With Applications to Electric, Magnetic, and Atomic Forces (Oxford Series in Optical and Imaging Sciences) - Hardcover

Sarid, Dror

Hardcover

ISBN 10: 0195062701 ISBN 13: 9780195062700

Publisher: Oxford University Press, 1991

Synopsis

Scanning tunneling microscopy (STM), invented by Binnig and Rohrer in 1982, enables one to obtain images reflecting surface electronic structure with atomic resolution. As an offshoot of this technology, Binnig, Quate and Gerber in 1986 invented atomic force microscopy (AFM), also capable of achieving atomic resolution. By now this technology proved to be an indispensable characterization tool with applications to surface physics and chemistry, material science, bio-science and data storage media, with promise in such areas as the semiconductor industry and optical quality control, for example. This book is the first attempt at organizing the whole rainbow of rapidly developing topics dealing with the mapping of a variety of forces across surfaces. Academic and industrial researchers using STM, or wishing to know more about its potential, will find this book a valuable source of up-to-date information.

About this title

About the Author

Dror Sarid is at University of Arizona-Tucson.

Review

From reviews of the first edition: "Quite instructive as to the capabilities and limitations of the SFM, and should ignite the enthusiasm of those unconverted to high resolution microscopy." --Journal of Colloid and Interface Science

"A valuable contribution to the literature, providing a sound theoretical basis." --Journal of Solid State Chemistry

"A useful introductory source. Its major strength is its concise overview of the different detection methods available and the theoretical noise floor available with each. . . . useful for its discussion of noise sources, and as a supplement to review articles already published in the field." --Andrew A. Gewirth (University of Illinois), Microscopy Research and Technique

"One of the nicest features of the book is a fairly comprehensive, full title, reference list complete to early 1993. Highly recommended to any microscopist working in force microscopy, especially in light of its low cover price."--Microscope

"Presents a theoretical background for scanning force microscopy (SFM) starting from first principles, with experimental and technical information incorporated into each chapter."--Materials Research Bulletin

Edition details

• Publisher: Oxford University Press
• Publication date: 1991
• Language: English
• ISBN 10: 0195062701
• ISBN 13: 9780195062700
• Binding: Hardcover
• Edition number: 1
• Number of pages: 272