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Introduction to Scanning Tunneling Microscopy (Oxford Series in Optical and Imaging Sciences) - Hardcover
Synopsis
Due to its nondestructive imaging power, scanning tunneling microscopy has found major applications in the fields of physics, chemistry, engineering, and materials science. This book provides a comprehensive treatment of scanning tunneling and atomic force microscopy, with full coverage of the imaging mechanism, instrumentation, and sample applications. The work is the first single-author reference on STM and presents much valuable information previously available only as proceedings or collections of review articles. It contains a 32-page section of remarkable STM images, and is organized as a self-contained work, with all mathematical derivations fully detailed. As a source of background material and current data, the book will be an invaluable resource for all scientists, engineers, and technicians using the imaging abilities of STM and AFM. It may also be used as a textbook in senior-year and graduate level STM courses, and as a supplementary text in surface science, solid-state physics, materials science, microscopy, and quantum mechanics.
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About the Author
C. Julian Chen is at IBM Thomas J. Watson Research Center.
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Introduction to Scanning Tunneling Microscopy (Oxford Series in Optical and Imaging Sciences)
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Oxford University Press, 1993
ISBN 10: 0195071506
ISBN 13: 9780195071504
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Introduction to Scanning Tunneling Microscopy
Published by
Oxford University Press, 1993
ISBN 10: 0195071506
ISBN 13: 9780195071504
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Hardcover
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Introduction to Scanning Tunneling Microscopy (Oxford Series in Optical and Imaging Sciences)
Published by
Oxford University Press, 1993
ISBN 10: 0195071506
ISBN 13: 9780195071504
Used
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Introduction to Scanning Tunneling Microscopy (Oxford Series in Optical and Imaging Sciences)
Published by
Oxford University Press, 1993
ISBN 10: 0195071506
ISBN 13: 9780195071504
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Introduction to Scanning Tunneling Microscopy
Published by
Oxford University Press, 1993
ISBN 10: 0195071506
ISBN 13: 9780195071504
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Introduction to Scanning Tunneling Microscopy
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Cary, North Carolina, U.S.A.: Oxford Univ Pr, 1993
ISBN 10: 0195071506
ISBN 13: 9780195071504
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Introduction to Scanning Tunneling Microscopy (Oxford Series in Optical and Imaging Sciences)
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Introduction to Scanning Tunneling Microscopy (Hardcover)
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Oxford University Press Inc, New York, 1993
ISBN 10: 0195071506
ISBN 13: 9780195071504
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Hardcover. Condition: new. Hardcover. Due to its nondestructive imaging power, scanning tunneling microscopy has found major applications in the fields of physics, chemistry, engineering, and materials science. This book provides a comprehensive treatment of scanning tunneling and atomic force microscopy, with full coverage of the imaging mechanism, instrumentation, and sample applications. The work is the first single-author reference on STM and presents much valuable information previously available only as proceedings or collections of review articles. It contains a 32-page section of remarkable STM images, and is organized as a self-contained work, with all mathematical derivations fully detailed. As a source of background material and current data, the book will be an invaluable resource for all scientists, engineers, and technicians using the imaging abilities of STM and AFM. It may also be used as a textbook in senior-year and graduate level STM courses, and as a supplementary text in surface science, solid-state physics, materials science, microscopy, and quantum mechanics. A guide to the use of STMs, written at the level of an advanced undergraduate physics student. The text can be read by nonspecialists working in related fields as well as students. Shipping may be from our Sydney, NSW warehouse or from our UK or US warehouse, depending on stock availability. Seller Inventory # 9780195071504
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Introduction to Scanning Tunneling Microscopy (Oxford Series in Optical and Imaging Sciences)
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Introduction to Scanning Tunneling Microscopy (Hardcover)
Published by
Oxford University Press Inc, New York, 1993
ISBN 10: 0195071506
ISBN 13: 9780195071504
New
Hardcover
Seller: Grand Eagle Retail, Mason, OH, U.S.A.
Seller rating 5 out of 5 stars
Hardcover. Condition: new. Hardcover. Due to its nondestructive imaging power, scanning tunneling microscopy has found major applications in the fields of physics, chemistry, engineering, and materials science. This book provides a comprehensive treatment of scanning tunneling and atomic force microscopy, with full coverage of the imaging mechanism, instrumentation, and sample applications. The work is the first single-author reference on STM and presents much valuable information previously available only as proceedings or collections of review articles. It contains a 32-page section of remarkable STM images, and is organized as a self-contained work, with all mathematical derivations fully detailed. As a source of background material and current data, the book will be an invaluable resource for all scientists, engineers, and technicians using the imaging abilities of STM and AFM. It may also be used as a textbook in senior-year and graduate level STM courses, and as a supplementary text in surface science, solid-state physics, materials science, microscopy, and quantum mechanics. A guide to the use of STMs, written at the level of an advanced undergraduate physics student. The text can be read by nonspecialists working in related fields as well as students. Shipping may be from multiple locations in the US or from the UK, depending on stock availability. Seller Inventory # 9780195071504
Quantity: 1 available