Surface analysis--the examination of the outer few nanometers of a material--is a routine undertaking in laboratories throughout the world, and is of great importance in such areas as corrosion, adhesion, polymer surface treatment, and microelectronics fabrication. This handbook provides anintroduction to the two most popular surface analysis X-ray photoelectron spectroscopy and Auger electron spectroscopy. It explains the underlying physical principles, discusses instrumentation, and looks at the interpretation of resulting spectra. Applications of the two techniquesare considered, and a critical comparison with other available methods is also included. This fully illustrated guide will be a valuable introduction for students and researchers in physics, engineering, and materials science.
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An Introduction to Surface Analysis by Electron Spectroscopy is a clear and accessible introduction to the key spectroscopic techniques used in surface analysis. Focusing on the two most popular surface science techniques; X-ray photoelectron spectroscopy (XPS) and Auger electron spectroscopy (AES), the book will be of benefit to both students and users in industry who require a rapid grounding in the methods before carrying out their own analysis.
Starting with an introduction to the basic concepts of electron spectroscopy, the text moves on to explain underlying physical principles, discusses the instrumentation employed and looks at the interpretation of the resulting spectra. The latest material on angle resolved XPS, surface engineering and complimentary methods have been included to provide an up-to-date account of these widely used techniques.
An Introduction to Surface Analysis by Electron Spectroscopy:
* is a readily accessible introduction to the key spectroscopic techniques in surface analysis.
* provides descriptions of the latest instruments and techniques.
* includes a detailed glossary of key surface analysis terms.
An invaluable text for both undergraduate and postgraduate students taking courses on materials, analysis and surface science. The book will also be a useful reference to those newcomers to surface science wishing to familiarise themselves with the necessary techniques.
John F Watts is Professor of Adhesion Science in the School of Engineering at the Unversity Surrey. He currently leads a Research Group applying surface analysis methods to investigations in materials science and is Editor-in-Chief of the Wiley journal Surface and Interface Analysis.
John Wolstenholme is Marketing Manager at Thermo VG Scientific. With a background in SIMS, he has been actively involved in XPS and AES for the last twelve years.
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