Items related to Trap Level Spectroscopy in Amorphous Semiconductors
Although amorphous semiconductors have been studied for over four decades, many of their properties are not fully understood. This book discusses not only the most common spectroscopic techniques but also describes their advantages and disadvantages.
- Provides information on the most used spectroscopic techniques
- Discusses the advantages and disadvantages of each technique
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About the Author:
Dr. Victor V. Mikla is affiliated with the Physical & Mathematical Disciplines, Department of Humanities & Natural Sciences, Uzhhgorod National University, Uzhhgorod,Ukraine
Victor I. Mikla, PhD, is Chair of Physical & Mathematical Disciplines in the Department of Humanities & Natural Sciences at Uzhhgorod National University, Uzhhorod, Ukraine. Dr. Mikla specializes in photo-electronic materials and devices, and has published research articles widely on a broad range of inter-disciplinary topics including metastable states in amorphous chalcogenides, trap level spectroscopy, medical and non-medical imaging applications of amorphous semiconductors, xerographic spectroscopy, photo-induced & structural changes, and raman scattering.
Victor I. Mikla, PhD, is Chair of Physical & Mathematical Disciplines in the Department of Humanities & Natural Sciences at Uzhhgorod National University, Uzhhorod, Ukraine. Dr. Mikla specializes in photo-electronic materials and devices, and has published research articles widely on a broad range of inter-disciplinary topics including metastable states in amorphous chalcogenides, trap level spectroscopy, medical and non-medical imaging applications of amorphous semiconductors, xerographic spectroscopy, photo-induced & structural changes, and raman scattering.
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- PublisherElsevier
- Publication date2010
- ISBN 10 0323165036
- ISBN 13 9780323165037
- BindingPaperback
- Edition number1
- Number of pages128
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