Non-Destructive Material Characterization Methods provides readers with a trove of theoretical and practical insight into how to implement different non-destructive testing methods for effective material characterization. The book starts with an introduction to the field before moving right into a discussion of a wide range of techniques that can be immediately implemented. Various imaging and microscopy techniques are first covered, with step-by-step insights on characterization using a polarized microscope, an atomic force microscope, computed tomography, ultrasonography, magnetic resonance imaging, infrared tomography, and more. Each chapter includes case studies, applications, and recent developments.
From there, elemental assay and mapping techniques are discussed, including Raman spectroscopy, UV spectroscopy, atomic absorption spectroscopy, neutron activation analysis, and various others. The book concludes with sections covering displacement measurement techniques, large-scale facility techniques, and methods involving multiscale analysis and advanced analysis.
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Dr. Akira Otsuki is a Visiting Professor at Luleå University of Technology, and the Unit coordinator and leading professor of the unit “Mine Tailings” at Universidad Adolfo Ibáñez. He is a member of several academic societies as well as an editor of academic journals including ChemEngineering and Recycling. He also serves as a guest editor of special issues, including “Colloidal/Fine Particle Aspects of Mine Tailings”. His research focuses on characterization and processing of complex materials, including waste materials, natural ores, and colloids. He has been developing and running national and international research projects on his research focuses.
Non-Destructive Material Characterization Methods provides readers with a trove of theoretical and practical insight into how to implement different non-destructive testing methods for effective material characterization. It starts with an introduction to the field before moving right into discussion of a wide range techniques you can immediately implement. Various imaging and microscopy techniques are first covered, with step-by-step insight on characterization using a polarized microscope, an atomic force microscope, computed tomography, ultrasonography, magnetic resonance imaging, infrared tomography, and more. From there elemental assay and mapping techniques are discussed, including Raman spectroscopy, UV spectroscopy, atomic absorption spectroscopy, neutron activation analysis, and various others. The book concludes with sections covering displacement measurement techniques, large scale facility techniques, and methods involving multiscale analysis and advanced analysis. Each chapter includes case studies, applications, and recent developments.
"About this title" may belong to another edition of this title.
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