Items related to HANDBOOK OF CHARGED PARTICLE OPTICS, 2ND EDITION
Synopsis
This timely handbook contains chapters on the essential elements of high resolution charged particle optics and is written by many of the worlds leading research scientists. It is a complete guide to understanding, designing, and using high resolution instrumentation such as transmission electron microscopes (TEMs), scanning electron microscopes (SEMs), scanning transmission electron microscopes (STEMs), and focused ion beam (FIB) systems. This handbook is evenly balanced between theory and application, and covers all the most important topics in this growing area. Handbook of High Resolution Charged Particle Optics explains how and why high resolution instruments work and how to apply this information when designing or using them.
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International Edition
Handbook of Charged Particle Optics, 2nd Edition (Original Price £ 160.00)
International EditionSeller: Basi6 International, Irving, TX, U.S.A.
Seller rating 5 out of 5 stars
Condition: Brand New. New.SoftCover International edition. Different ISBN and Cover image but contents are same as US edition.Expediting shipping for all USA and Europe orders excluding PO Box. Excellent Customer Service. Seller Inventory # ABEOCT25-362559