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Defect analysis in electron microscopy
Published by
Wiley : distributed by Halstead Press, 1975
ISBN 10: 0412137704
ISBN 13: 9780412137709
Used
Paperback
Seller: ThriftBooks-Dallas, Dallas, TX, U.S.A.
Seller rating 5 out of 5 stars
Paperback. Condition: Good. No Jacket. Pages can have notes/highlighting. Spine may show signs of wear. ~ ThriftBooks: Read More, Spend Less. Seller Inventory # G0412137704I3N00