Items related to Fundamentals of Surface and Thin Film Analysis
Synopsis
This book focuses on the physics underlying techniques used to analyze the surface region of materials. It is a book written for the materials scientist interested in the use of electron spectroscopies or ion beam analysis for sample characterization, for the materials analyst who needs information on techniques that are available outside the laboratory, and particularly for students who will use this new generation of analytical techniques in their research.
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- PublisherNorth-Holland
- Publication date1986
- ISBN 10 0444009892
- ISBN 13 9780444009890
- BindingHardcover
- LanguageEnglish
- Edition number6
- Number of pages352
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