Material Diffraction and Imaging Techniques explores methods to examine atomic structures using radiation interactions. It categorizes observation techniques based on radiation wavelengths, including ions, X-rays, neutrons, and electrons. Topics covered include transmission electron microscopy, weak-beam methods, and phase transition applications. The 13-chapter volume starts with kinematic theory overviews and treats diffraction by deformed crystals. It delves into dynamical theory, absorption treatment, planar interface studies, and weak-beam image analysis. The book also covers defect identification using computed electron micrographs, dislocation loop analysis, and small coherent particle detection. It introduces diffuse scattering interpretation, short-range order, and martensitic transformation crystallography, benefiting students, researchers, and scientists.
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