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Synopsis
This book covers state-of-the-art techniques commonly used in modern materials characterization. Two important aspects of characterization, materials structures and chemical analysis, are included. Widely used techniques, such as metallography (light microscopy), X-ray diffraction, transmission and scanning electron microscopy, are described. In addition, the book introduces advanced techniques, including scanning probe microscopy. The second half of the book accordingly presents techniques such as X-ray energy dispersive spectroscopy (commonly equipped in the scanning electron microscope), fluorescence X-ray spectroscopy, and popular surface analysis techniques (XPS and SIMS). Finally, vibrational spectroscopy (FTIR and Raman) and thermal analysis are also covered.
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From the Back Cover
This work is a clearly written and highly illustrated introduction to modern characterization techniques, enabling users to understand the composition and structure of materials. Encompassing not just material structure but also chemical analysis, Materials Characterization covers all key structural and functional materials from metals and semiconductors to polymers and ceramics.
- Details state-of-the-art techniques commonly used in modern materials characterization, including metallography, X-ray diffraction, electron and scanning probe microscopies, X-ray energy dispersive spectroscopy, vibrational spectroscopy, popular surface analysis techniques, and thermal analysis
- Explains in simple terms how the instruments work, providing a practical guide to experimental set-up
- Contains numerous graphics to illustrate concepts and techniques
- Extensive end-of-chapter questions help with readers' understanding
- Based on ten years’ experience of a successful course
Materials Characterization is an introductory book ideal for scientists and engineers embarking on material-related research and development. It is also an essential tool for advanced undergraduate and postgraduate students taking a first course on the topic.
About the Author
Yang Leng is a Professor of Materials Science at Hong Kong University of Science and Technology. His research focuses on mechanical behavior of engineering materials, biomedical materials, and novel materials processing. Professor Leng has authored nearly 80 papers in international journals and has been granted two US patents. In addition, he commissioned more than a dozen industrial reports. His contribution to teaching materials science is exemplified by the Teaching Excellence Appreciation award from the HKUST.
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- PublisherJohn Wiley & Sons Inc
- Publication date2008
- ISBN 10 0470822988
- ISBN 13 9780470822982
- BindingHardcover
- LanguageEnglish
- Edition number1
- Number of pages337
- Rating
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Materials Characterization: Introduction to Microscopic and Spectroscopic Methods
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