Materials Analysis Using a Nuclear Microprobe - Hardcover

Breese, Mark B. H.; Jamieson, David N.; King, Philip J. C.

Hardcover

ISBN 10: 0471106089 ISBN 13: 9780471106081

Publisher: Wiley-VCH, 1996

Synopsis

Three leading scientists combine their knowledge, gained over many years in two major microprobe facilities, to present an overview of the basic aspects of the technical requirements as well as detailed descriptions regarding the various uses of nuclear microprobes for materials analysis. Covers such topics as ion-solid interactions, crystallography and ion optics. Fully explains all the experimental factors associated with new analytical developments.

About this title

About the Author

MARK B. H. BREESE, PhD, is a Research Fellow in Physics at Oxford University and a member of the Nuclear Microprobe Group, where he works on the design and construction of a new generation of nuclear microprobes. A former Australian Research Fellow, he has worked with the Melbourne Nuclear Microprobe Group on further refining and understanding microprobe optics and analytical techniques.

DAVID N. JAMIESON, PhD, is Associate Professor of Physics at the University of Melbourne, where he is also Director of the Microanalytical Research Centre. Dr. Jamieson has worked as a postdoctoral research fellow in the Division of Applied Physics and Electrical Engineering at Caltech and as a Departmental Research Associate at Oxford University's SPM Unit in the Nuclear Physics Laboratory.

PHILIP J. C. KING, PhD, is a Research Fellow in Physics at Oxford University, where he is working in the SPM Unit in the Nuclear Physics Laboratory. His research interests have focused on exploring the use of nuclear microprobes to produce images of crystal defects.

From the Back Cover

Everything materials scientists need to know about the powerful analytical tools of nuclear microprobe technology

This much-awaited volume covers, in a thoroughly accessible and informative way, the fast-growing field of nuclear microprobe technology and the methods for utilizing focused-light ion beams in materials characterization. Unlike any other book on the market, it concentrates on the specific needs of materials scientists and presents a comprehensive guide to all practical and theoretical aspects of this technology.

Written by leading experts in the field from major microprobe centers, the book provides
* Coverage of all new nuclear microprobe hardware, and new ion beam techniques for materials modifications and analysis
* Detailed descriptions of the various uses of nuclear microprobes in materials analysis
* An overview of the basic aspects of the technical requirements for microprobe analysis
* Help in planning and managing experiments using these new analytical techniques
* Introductions and background material to important topics, such as ion-solid interactions, crystallography, and ion optics
* 240 illustrations that help explain complex points
* Two chapters supplemented with four-color figures
* Topics of interest to researchers in the fields of nuclear microscopy and materials and microelectronic device analysis and fabrication, as well as those in accelerator laboratories

Materials Analysis Using a Nuclear Microprobe is an invaluable resource for both experienced researchers and newcomers to the field, for students at the graduate level, and for scientists from a wide range of disciplines who would like to find out more about research opportunities in this exciting and promising field.

The emphasis in the areas of ion-solid interactions and nuclear microprobes has now shifted from the realm of pure scientific inquiry to the arena of applications. Driven partially by the development of semiconductor devices, this technology now provides powerful new tools in two important research areas--ion beam modification of materials and ion beam analysis.

This book deals with the application of finely focused high-energy ion beams in materials characterization, and how they turn ion beam spectrometry into ion beam microscopy. The text includes fundamental principles in crystallography and solid-state physics, as well as the current state of the art in MeV ion optics--all of which play an important role in this technology.

Along with in-depth coverage of the various processes involved in nuclear microscopy and ion-solid interactions, the book explores nuclear microprobe hardware in detail, examines various applications of nuclear microprobes for materials analysis, and considers all experimental aspects of using these new analytical methods.

The authors draw on their work at the pioneering nuclear microprobe facilities at Oxford and Melbourne Universities. They share their insight and knowledge throughout and help simplify many complex problems that arise when focusing MeV ion beams down to submicron spots, or when dealing with the vast amount of data these experiments yield. Their discussion of ion beam analysis techniques is accessible and useful, addressing in particular the needs of materials scientists in a wide range of fields, while also providing information of more general appeal to other scientists involved in ion beam work. It also demonstrates how conventional and widely applied ion beam analysis with unfocused beams can be enormously enhanced by use of a focused beam.

In addition to its complete and up-to-date treatment of the subject, Materials Analysis Using a Nuclear Microprobe affords us a glimpse of the future--pointing in the direction this technology is going, showing the influence it is bound to have on the work done in laboratories worldwide, and suggesting the new possibilities this will open up for a variety of ion beam applications.

Edition details

• Publisher: Wiley-VCH
• Publication date: 1996
• Language: English
• ISBN 10: 0471106089
• ISBN 13: 9780471106081
• Binding: Hardcover
• Edition number: 1
• Number of pages: 464