Items related to Exploring Scanning Probe Microscopy with Mathematica
This book/software edition provides a complete set of computational models that describe the physical phenomena associated with scanning tunneling microscopy, atomic force microscopy, and related technologies. Its self-contained presentation spares researchers the valuable time spent hunting through the technical literature in search of prior theoretical results required to understand the models presented. Mathematica code for all examples is included both in the book and at the accompanying ftp site, affording the freedom to change, at will, the values and parameters of specific problems or even modify the programs themselves to suit various modeling needs.
Exploring Scanning Probe Microscopy with Mathematica is both a solid professional reference and an advanced-level text, beginning with scanning probe microscopy basics and moving on to cutting-edge techniques, experiments, and theory. In the section devoted to atomic force microscopy, Dr. Sarid describes the mechanical properties of cantilevers, atomic force microscope tip-sample interactions, and cantilever vibration characteristics. This is followed by an in-depth treatment of theoretical and practical aspects of tunneling phenomena, including metal-insulator-metal tunneling and Fowler-Nordheim field emission. The final section features chapters covering density of states in arbitrary dimensions, quantum wells and dots, and electrostatics.
Exploring Scanning Probe Microscopy with Mathematica is both a solid professional reference and an advanced-level text, beginning with scanning probe microscopy basics and moving on to cutting-edge techniques, experiments, and theory. In the section devoted to atomic force microscopy, Dr. Sarid describes the mechanical properties of cantilevers, atomic force microscope tip-sample interactions, and cantilever vibration characteristics. This is followed by an in-depth treatment of theoretical and practical aspects of tunneling phenomena, including metal-insulator-metal tunneling and Fowler-Nordheim field emission. The final section features chapters covering density of states in arbitrary dimensions, quantum wells and dots, and electrostatics.
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From the Publisher:
A collection of self-contained, interactive and computational examples from the field of scanning probe microscopy and related technologies using Mathematica notebooks. This book allows users to work with interactive models change the values and parameters of specific problems.
About the Author:
DROR SARID is a professor in the Optical Sciences Center, University of Arizona, Tucson. He received his PhD in physics from the Hebrew University in Jerusalem. Dr. Sarid is the author of Scanning Force Microscopy with Applications to Electric, Magnetic and Atomic Forces.
"About this title" may belong to another edition of this title.
- PublisherWiley-VCH
- Publication date1997
- ISBN 10 0471168181
- ISBN 13 9780471168188
- BindingHardcover
- Edition number1
- Number of pages262
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