Spectroscopic Ellipsometry and Reflectometry: A User's Guide

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9780471181729: Spectroscopic Ellipsometry and Reflectometry: A User's Guide
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While single wave ellipsometry has been around for years, spectroscopic ellipsometry is fast becoming the method of choice for measuring the thickness and optical properties of thin films. This book provides the first practical introduction to spectroscopic ellipsometry and the related techniques of reflectometry. A guide for practitioners and researchers in a variety of disciplines, it addresses a broad range of applications in physics, chemistry, electrical engineering, and materials science.

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Book Description John Wiley & Sons Inc, United States, 1999. Hardback. Condition: New. 1. Auflage. Language: English. Brand new Book. While single wave ellipsometry has been around for years, spectroscopic ellipsometry is fast becoming the method of choice for measuring the thickness and optical properties of thin films. This book provides the first practical introduction to spectroscopic ellipsometry and the related techniques of reflectometry. A guide for practitioners and researchers in a variety of disciplines, it addresses a broad range of applications in physics, chemistry, electrical engineering, and materials science. Seller Inventory # AAH9780471181729

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William A. McGahan, Harland G. Tompkins
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Book Description John Wiley & Sons Inc, United States, 1999. Hardback. Condition: New. 1. Auflage. Language: English. Brand new Book. While single wave ellipsometry has been around for years, spectroscopic ellipsometry is fast becoming the method of choice for measuring the thickness and optical properties of thin films. This book provides the first practical introduction to spectroscopic ellipsometry and the related techniques of reflectometry. A guide for practitioners and researchers in a variety of disciplines, it addresses a broad range of applications in physics, chemistry, electrical engineering, and materials science. Seller Inventory # AAH9780471181729

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Book Description John Wiley & Sons Inc, United States, 1999. Hardback. Condition: New. 1. Auflage. Language: English. Brand new Book. While single wave ellipsometry has been around for years, spectroscopic ellipsometry is fast becoming the method of choice for measuring the thickness and optical properties of thin films. This book provides the first practical introduction to spectroscopic ellipsometry and the related techniques of reflectometry. A guide for practitioners and researchers in a variety of disciplines, it addresses a broad range of applications in physics, chemistry, electrical engineering, and materials science. Seller Inventory # LIE9780471181729

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