Items related to Spectroscopic Ellipsometry and Reflectometry: A User's...
Synopsis
While single wave ellipsometry has been around for years, spectroscopic ellipsometry is fast becoming the method of choice for measuring the thickness and optical properties of thin films. This book provides the first practical introduction to spectroscopic ellipsometry and the related techniques of reflectometry. A guide for practitioners and researchers in a variety of disciplines, it addresses a broad range of applications in physics, chemistry, electrical engineering, and materials science.
"synopsis" may belong to another edition of this title.
About the Author
Harland Tompkins retired from full-time employment in 2001. During his full-time employment, he was employed by General Electric Co., Bell Laboratories, the Idaho National Engineering Lab, and Motorola.
William A. McGahan is the author of Spectroscopic Ellipsometry and Reflectometry: A User's Guide, published by Wiley.
"About this title" may belong to another edition of this title.
- PublisherWiley-Interscience
- Publication date1999
- ISBN 10 0471181722
- ISBN 13 9780471181729
- BindingHardcover
- LanguageEnglish
- Edition number1
- Number of pages248
Search results for Spectroscopic Ellipsometry and Reflectometry: A User's...
Stock Image
Spectroscopic Ellipsometry and Reflectometry: A User's Guide
Seller: Orion Tech, Kingwood, TX, U.S.A.
Seller rating 5 out of 5 stars
hardcover. Condition: New. Seller Inventory # 0471181722-11-30234833
Quantity: 1 available
Stock Image
Spectroscopic Ellipsometry and Reflectometry: A User's Guide
Seller: Recycle Bookstore, San Jose, CA, U.S.A.
Seller rating 4 out of 5 stars
Hardcover. Condition: Very Good. Book has lightly exposed binding between front endpaper and title page, a light crease along length of back endpaper near binding, light rubbing and smudging to covers, light bumps to outer bottom corners, light bumps to edges. otherwise in very good condition, strong binding, clean and unmarked pages; some light cosmetic wear but an overall sturdy, attractive copy with bright interiors. Seller Inventory # 986099
Quantity: 1 available
Seller Image
Spectroscopic Ellipsometry and Reflectometry : A User's Guide
Seller: GreatBookPrices, Columbia, MD, U.S.A.
Seller rating 5 out of 5 stars
Condition: New. Seller Inventory # 31212-n
Quantity: Over 20 available
Stock Image
Spectroscopic Ellipsometry and Reflectometry: A User's Guide
Seller: Lucky's Textbooks, Dallas, TX, U.S.A.
Seller rating 5 out of 5 stars
Condition: New. Seller Inventory # ABLIING23Feb2215580222998
Quantity: Over 20 available
Stock Image
Spectroscopic Ellipsometry and Reflectometry
Seller: PBShop.store UK, Fairford, GLOS, United Kingdom
Seller rating 4 out of 5 stars
HRD. Condition: New. New Book. Shipped from UK. Established seller since 2000. Seller Inventory # FW-9780471181729
Quantity: 15 available
Seller Image
Spectroscopic Ellipsometry and Reflectometry : A User's Guide
Seller: GreatBookPrices, Columbia, MD, U.S.A.
Seller rating 5 out of 5 stars
Condition: As New. Unread book in perfect condition. Seller Inventory # 31212
Quantity: Over 20 available
Seller Image
Spectroscopic Ellipsometry and Reflectometry : A User's Guide
Seller: GreatBookPricesUK, Woodford Green, United Kingdom
Seller rating 5 out of 5 stars
Condition: New. Seller Inventory # 31212-n
Quantity: Over 20 available
Stock Image
Spectroscopic Ellipsometry and Reflectometry: A User's Guide
Seller: Ria Christie Collections, Uxbridge, United Kingdom
Seller rating 5 out of 5 stars
Condition: New. In. Seller Inventory # ria9780471181729_new
Quantity: Over 20 available
Stock Image
Spectroscopic Ellipsometry and Reflectometry (Hardcover)
Published by
John Wiley & Sons Inc, New York, 1999
ISBN 10: 0471181722
ISBN 13: 9780471181729
New
Hardcover
First Edition
Seller: Grand Eagle Retail, Fairfield, OH, U.S.A.
Seller rating 5 out of 5 stars
Hardcover. Condition: new. Hardcover. Ellipsometry is an optical technique used to measure thickness and optical properties of thin films. Single wave ellipsometry has been around for years, but now spectroscopic ellipsometry has entered the mainstream of industrial laboratories. This is a practical introduction to spectroscopic ellipsometry and the related technique of reflectometry. In addition to an introduction to the fundamentals, the book includes applications and case studies. While single wave ellipsometry has been around for years, spectroscopic ellipsometry is fast becoming the method of choice for measuring the thickness and optical properties of thin films. This book provides the first practical introduction to spectroscopic ellipsometry and the related techniques of reflectometry. Shipping may be from multiple locations in the US or from the UK, depending on stock availability. Seller Inventory # 9780471181729
Quantity: 1 available
Seller Image
Spectroscopic Ellipsometry and Reflectometry : A User's Guide
Seller: GreatBookPricesUK, Woodford Green, United Kingdom
Seller rating 5 out of 5 stars
Condition: As New. Unread book in perfect condition. Seller Inventory # 31212
Quantity: Over 20 available