A Practical Guide for the Preparation of Specimens for X-Ray Fluorescence and X-Ray Diffraction Analysis

Hardcover

ISBN 10: 0471194581 ISBN 13: 9780471194583

Publisher: Wiley-VCH, 1997

The first hands-on guide to XRD and XRF sampling and specimenpreparation

Systematic errors from poor sampling and improper specimenpreparation can easily render X-ray diffraction (XRD) and X-rayfluorescence (XRF) data of questionable use for analysis. But,until now, the practical information that can help to reduce theseerrors has never been readily available in one volume.

This book fills a vital gap in the literature, bringing together awealth of material previously available only in workbooks, companymanuals, and other inside sources. It provides detailed coverage ofthe major tasks involved in X-ray analysis - complete with theory,step-by-step methods, equipment suggestions, and problem-solvingtips.

With a full complement of tools and techniques, this comprehensiveguide helps both beginners and experienced analysts to make thebest decision on sample treatment and get accurate XRD and XRFresults-saving valuable time, money, and effort.

Covers X-ray techniques for analyzing biological, geological,metallic, ceramic, and other materials
* Addresses all aspects of specimen preparation, including handlingunusual or very small samples, liquids and solutions, andmore
* Features special chapters on specimen preparation equipment andXRF standards
* Contains useful bibliography and helpful references.

From the Publisher:

This book is the first to discuss specimen preparation for X-ray diffraction (XRD) and X-ray fluorescence (XRF), powerful analytical tools for determining molecular composition and structure. Written to help either beginners or experienced X-ray analysts, it offers detailed information on the correct ways to select a sample from a bulk material and prepare a specimen from the sample, thus avoiding serious and costly errors in analysis. Each chapter provides essential theoretical background, step-by-step methods, suggestions about finding necessary equipment needed, and recommended literature references.

About the Author:

VICTOR E. BUHRKE heads The Buhrke Company in Redwood City,California.

RON JENKINS is the general manager of the International Center forDiffraction Data in Newton Square, Pennsylvania.

DEANE K. SMITH is a professor emeritus in the Department ofGeosciences at Pennsylvania State University.