A Practical Guide for the Preparation of Specimens for X-Ray Fluorescence and X-Ray Diffraction Analysis

Hardcover

ISBN 10: 0471194581 ISBN 13: 9780471194583

Publisher: Wiley-VCH, 1997

The first hands-on guide to XRD and XRF sampling and specimen preparation

Systematic errors from poor sampling and improper specimen preparation can easily render X-ray diffraction (XRD) and X-ray fluorescence (XRF) data of questionable use for analysis. But, until now, the practical information that can help to reduce these errors has never been readily available in one volume.

This book fills a vital gap in the literature, bringing together a wealth of material previously available only in workbooks, company manuals, and other inside sources. It provides detailed coverage of the major tasks involved in X-ray analysis - complete with theory, step-by-step methods, equipment suggestions, and problem-solving tips.

With a full complement of tools and techniques, this comprehensive guide helps both beginners and experienced analysts to make the best decision on sample treatment and get accurate XRD and XRF results-saving valuable time, money, and effort.

Covers X-ray techniques for analyzing biological, geological, metallic, ceramic, and other materials
* Addresses all aspects of specimen preparation, including handling unusual or very small samples, liquids and solutions, and more
* Features special chapters on specimen preparation equipment and XRF standards
* Contains useful bibliography and helpful references.

From the Publisher:

This book is the first to discuss specimen preparation for X-ray diffraction (XRD) and X-ray fluorescence (XRF), powerful analytical tools for determining molecular composition and structure. Written to help either beginners or experienced X-ray analysts, it offers detailed information on the correct ways to select a sample from a bulk material and prepare a specimen from the sample, thus avoiding serious and costly errors in analysis. Each chapter provides essential theoretical background, step-by-step methods, suggestions about finding necessary equipment needed, and recommended literature references.

About the Author:

VICTOR E. BUHRKE heads The Buhrke Company in Redwood City, California.

RON JENKINS is the general manager of the International Center for Diffraction Data in Newton Square, Pennsylvania.

DEANE K. SMITH is a professor emeritus in the Department of Geosciences at Pennsylvania State University.