Intellectual Property Damages: Guidelines and Analysis, 2004 Supplement - Softcover

Glick, Mark A.; Reymann, Lara A.; Hoffman, Richard

Softcover

ISBN 10: 0471464597 ISBN 13: 9780471464594

Publisher: Wiley, 2004

Synopsis

The first supplement to Intellectual Property Damages: Guidelines and Analysis contains the following new chapters:

• Chapter 5A: Applying Statistical Analysis to the Market Approach
• Chapter 5B: Use of Event Studies in Damage Calculations
• Chapter 7A: How to Calculate Patent Damages?Update
• Chapter 14A: Cost Analysis
• Chapter 14B: Risk, Discount Rates, and Prejudgment Interest

About this title

About the Author

Mark A. Glick has a Ph.D. in economics and a J.D. in law. He is a professor of economics at the University of Utah Department of Economics, where he teaches law and economics and industrial organization. He also serves as Of Counsel with the law firm Parsons Behle & Latimer, where he practices in the areas of intellectual property and antitrust. He is a graduate of UCLA, The New School for Social Research, and Columbia University.

Lara A. Reymann is a member of the Litigation Department at Parsons Behle & Latimer, where she practices intellectual property law. Ms. Reymann graduated cum laude from Dartmouth College with a B.A. in government and a minor in philosophy. She received her J.D. with honors from the University of Chicago Law School, where she worked in the Mandel Legal Aid Clinic for several years.

Richard Hoffman is a director at LECG with over 12 years of experience in accounting and consulting. He is a CPA and is Accredited in Business Valuations. Rick worked at international accounting firms for approximately 10 years before joining LECG in 2000. He also has been an adjunct professor at the University of Utah.

Edition details

• Publisher: Wiley
• Publication date: 2004
• Language: English
• ISBN 10: 0471464597
• ISBN 13: 9780471464594
• Binding: Paperback
• Edition number: 1
• Number of pages: 112