Accelerated Testing: Statistical Models, Test Plans, and Data Analysis - Softcover

Nelson, Wayne B.

Softcover

ISBN 10: 0471697362 ISBN 13: 9780471697367

Publisher: Wiley-Interscience, 2004

Synopsis

The Wiley-Interscience Paperback Series consists of selected books that have been made more accessible to consumers in an effort to increase global appeal and general circulation. With these new unabridged softcover volumes, Wiley hopes to extend the lives of these works by making them available to future generations of statisticians, mathematicians, and scientists.

". . . a goldmine of knowledge on accelerated life testing principles and practices . . . one of the very few capable of advancing the science of reliability. It definitely belongs in every bookshelf on engineering."
–Dev G. Raheja, Quality and Reliability Engineering International

". . . an impressive book. The width and number of topics covered, the practical data sets included, the obvious knowledge and understanding of the author and the extent of published materials reviewed combine to ensure that this will be a book used frequently."
–Journal of the Royal Statistical Society

A benchmark text in the field, Accelerated Testing: Statistical Models, Test Plans, and Data Analysis offers engineers, scientists, and statisticians a reliable resource on the effective use of accelerated life testing to measure and improve product reliability. From simple data plots to advanced computer programs, the text features a wealth of practical applications and a clear, readable style that makes even complicated physical and statistical concepts uniquely accessible. A detailed index adds to its value as a reference source.

About this title

From the Publisher

In recent years, much useful methodology has been developed in accelerated testing--this book makes it available to practitioners. Many products last so long that life testing at design conditions is impractical. However, these products can be life-tested at high-stress conditions to yield failures quickly. Such testing saves much time and money--and analyses of data from an accelerated test yield needed information on product life at design (low stress) conditions. Presents practical, modern, statistical methods for accelerated testing including test models, analyses of data and plans for testing. Each topic is self-contained for easy reference. Coverage is broad and detailed enough to serve as a text or reference. Contains many real test examples along with data analyses, computer programs and references to the literature.

About the Author

WAYNE B. NELSON, PhD, is a leading expert on analysis of reliability and accelerated test data. Formerly with General Electric Research & Development for twenty-three years, he now privately consults on and teaches engineering applications of statistics for many companies, professional societies, and universities. For his outstanding contributions to reliability data analysis and accelerated testing, he was elected a Fellow of the Institute of Electrical and Electronics Engineers, the American Society for Quality, and the American Statistical Association.

Edition details

• Publisher: Wiley-Interscience
• Publication date: 2004
• ISBN 10: 0471697362
• ISBN 13: 9780471697367
• Binding: Paperback
• Language: English
• Edition number: 1
• Number of pages: 624