Practical Surface Analysis, Auger and X-ray Photoelectron Spectroscopy (Volume 1) - Softcover

Softcover

ISBN 10: 0471920819 ISBN 13: 9780471920816

Publisher: Wiley, 1990

Synopsis

The growth and diversification of surface analytical techniques began in the 1960s with the development of electron spectroscopy - first Auger electron spectroscopy (AES), closely followed by X-ray photo-electron spectroscopy (XPS or ESCA). Today these two complementary techniques still dominate the surface analysis scene.

About this title

From the Publisher

Since the publication of the first edition, practical surface analysis has grown and diversified to such an extent that the editors have found it necessary to produce a new companion volume to cover the fields of ion and neutral spectroscopy. This first volume of the two-volume set discusses two closely related analytical techniques--Auger and X-ray photoelectron spectroscopy. Beginning with historical background of both AES and XPS, it provides in-depth examination of theory and practice of the two techniques. Information on instrumentation, spectral interpretation, depth profiling and quantification are also included. Volume II also discusses the treatment of ion and neutral techniques, but in a different manner because they have less in common than the electron spectroscopies. Volume II includes material on SIMS Instrumentation, dynamic SIMS, and SNMS (sputtered neutral mass spectrometry). Both volumes have numerous appendices.

Edition details

• Publisher: Wiley
• Publication date: 1990
• Language: English
• ISBN 10: 0471920819
• ISBN 13: 9780471920816
• Binding: Paperback
• Edition number: 1
• Number of pages: 674
• Editor: Briggs D., Seah M. P.