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E. Ajith Amerasekera is the author of Failure Mechanisms in Semiconductor Devices, 2nd Edition, published by Wiley. Farid N. Najm is the author of Failure Mechanisms in Semiconductor Devices, 2nd Edition, published by Wiley.
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Book Description Gebunden. Condition: New. Failure Mechanisms in Semiconductor Devices Second Edition E. Ajith Amerasekera Texas Instruments Inc., Dallas, USA Farid N. Najm University of Illinois at Urbana-Champaign, USA Since the successful first edition of Failure Mechanisms in Semiconductor Devic. Seller Inventory # 446918635
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Book Description Condition: New. In this second edition, the authors identify the sources of failure mechanism in semiconductor devices, examine possible detection and elimination techniques, and determine the effectiveness of reliability devices. The references have been updated and recent advances are discussed. Num Pages: 358 pages, Illustrations. BIC Classification: PHFC; TGMT; TGPR; TJFD5. Category: (P) Professional & Vocational. Dimension: 239 x 165 x 25. Weight in Grams: 676. . 1997. 2nd Edition. Hardcover. . . . . Seller Inventory # V9780471954828
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Book Description Hardcover. Condition: Brand New. 2nd sub edition. 345 pages. 9.50x6.50x1.00 inches. In Stock. Seller Inventory # __0471954829