Synopsis
This book explains the use of interferometry to measure surfaces and thin films. This is important for measurement of the surface roughness of manufactured products. This technique is discussed as a more cost effective means of determining these crucial measurements than by electron microscopy. By this means it is possible to study topography and thin films down to the molecular level. At the time of the publication of this book this technique was used for the characterization of cleavage, optical and dielectric properties of mica, optical properties of metallic films and thin films, and surface characterization of plastics. The book exams in detail examples such as quartz, mica surfaces and sheets, selenite, calcite, and diamonds, and the corresponding problems of cleavage lines, measurement of small angles, correlation of fringes, and the methods of calculation.
"synopsis" may belong to another edition of this title.
Other Popular Editions of the Same Title
Search results for Multiple-beam Interferometry of Surfaces and Films...
Stock Image
Multiple-beam Interferometry of Surfaces and Films by S. Tolansky (1970-05-03)
Seller: ThriftBooks-Atlanta, AUSTELL, GA, U.S.A.
Seller rating 5 out of 5 stars
Paperback. Condition: Very Good. No Jacket. May have limited writing in cover pages. Pages are unmarked. ~ ThriftBooks: Read More, Spend Less. Seller Inventory # G0486622150I4N00
Stock Image
Multiple-beam Interferometry of Surfaces and Films by S. Tolansky (1970-05-03)
Seller: HPB-Ruby, Dallas, TX, U.S.A.
Seller rating 5 out of 5 stars
paperback. Condition: Very Good. Connecting readers with great books since 1972! Used books may not include companion materials, and may have some shelf wear or limited writing. We ship orders daily and Customer Service is our top priority! Seller Inventory # S_450670194
Seller Image
Multiple-beam Interferometry of Surfaces and Films by S. Tolansky (1970-05-03)
Seller: Solr Books, Lincolnwood, IL, U.S.A.
Seller rating 5 out of 5 stars
Condition: acceptable. This book is in Acceptable condition. All pages are intact, but may have lots of notes, water damage or other issues and be ex library. Seller Inventory # BCV.0486622150.A
Stock Image
Multiple beam Interferometry of Surfaces and Films
Seller: Mythos Center Books, Frontenac, MN, U.S.A.
Seller rating 5 out of 5 stars
paperback. Condition: Used: Very Good. vg paperback. Seller Inventory # 66257
Seller Image
Multiple-Beam Interferometry of Surfaces and Films by S. Tolansky
Published by
Dover Publications, New York, NY, 1970
ISBN 10: 0486622150
ISBN 13: 9780486622156
Used
Paperback
Seller: True Oak Books, Highland, NY, U.S.A.
Seller rating 5 out of 5 stars
Paperback. Condition: Good+. Reissue Edition. 186 pages; B&W illustrations. Previous owner's name on the inside of the front cover and on the half-title page. Minor notes from previous owner on the last preface page. Light fading on the covers and spine. Light yellowing on pages. Few minor speckles on the exterior edges of textblock. Good condition otherwise. No other noteworthy defects. No markings on text pages. ; - Your satisfaction is our priority. We offer free returns and respond promptly to all inquiries. Your item will be carefully cushioned in bubble wrap and securely boxed. All orders ship on the same or next business day. Buy with confidence. Seller Inventory # TOB223-58293-A-2.35
Stock Image
Multiple-beam Interferometry of Surfaces and Films by S. Tolansky (1970-05-03)
Seller: Mispah books, Redhill, SURRE, United Kingdom
Seller rating 4 out of 5 stars
paperback. Condition: Acceptable. Acceptable. Dust Jacket NOT present. CD WILL BE MISSING. SHIPS FROM MULTIPLE LOCATIONS. book. Seller Inventory # ERICA82904866221506
Buy Used
US$ 131.06
US$ 33.49 shipping
Ships from United Kingdom to U.S.A.
Ships from United Kingdom to U.S.A.
Quantity: 1 available