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Synopsis
This book explains the use of interferometry to measure surfaces and thin films. This is important for measurement of the surface roughness of manufactured products. This technique is discussed as a more cost effective means of determining these crucial measurements than by electron microscopy. By this means it is possible to study topography and thin films down to the molecular level. At the time of the publication of this book this technique was used for the characterization of cleavage, optical and dielectric properties of mica, optical properties of metallic films and thin films, and surface characterization of plastics. The book exams in detail examples such as quartz, mica surfaces and sheets, selenite, calcite, and diamonds, and the corresponding problems of cleavage lines, measurement of small angles, correlation of fringes, and the methods of calculation.
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Multiple-beam Interferometry of Surfaces and Films by S. Tolansky (1970-05-03)
Seller: Solr Books, Lincolnwood, IL, U.S.A.
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Condition: acceptable. This book is in Acceptable condition. All pages are intact, but may have lots of notes, water damage or other issues and be ex library. Seller Inventory # BCV.0486622150.A
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Multiple-Beam Interferometry of Surfaces and Films by S. Tolansky
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Dover Publications, New York, NY, 1970
ISBN 10: 0486622150
ISBN 13: 9780486622156
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Seller: True Oak Books, Highland, NY, U.S.A.
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Paperback. Condition: Good+. Reissue Edition. 186 pages; B&W illustrations. Previous owner's name on the inside of the front cover and on the half-title page. Minor notes from previous owner on the last preface page. Light fading on the covers and spine. Light yellowing on pages. Few minor speckles on the exterior edges of textblock. Good condition otherwise. No other noteworthy defects. No markings on text pages. ; - Your satisfaction is our priority. We offer free returns and respond promptly to all inquiries. Your item will be carefully cushioned in bubble wrap and securely boxed. All orders ship on the same or next business day. Buy with confidence. Seller Inventory # TOB223-58293-A-2.35
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Multiple-beam Interferometry of Surfaces and Films by S. Tolansky (1970-05-03)
Seller: Mispah books, Redhill, SURRE, United Kingdom
Seller rating 4 out of 5 stars
paperback. Condition: Acceptable. Acceptable. Dust Jacket NOT present. CD WILL BE MISSING. SHIPS FROM MULTIPLE LOCATIONS. book. Seller Inventory # ERICA82904866221506
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