Originally published in 2005, this book covers the closely related techniques of electron microprobe analysis (EMPA) and scanning electron microscopy (SEM) specifically from a geological viewpoint. Topics discussed include: principles of electron-target interactions, electron beam instrumentation, X-ray spectrometry, general principles of SEM image formation, production of X-ray 'maps' showing elemental distributions, procedures for qualitative and quantitative X-ray analysis (both energy-dispersive and wavelength-dispersive), the use of both 'true' electron microprobes and SEMs fitted with X-ray spectrometers, and practical matters such as sample preparation and treatment of results. Throughout, there is an emphasis on geological aspects not mentioned in similar books aimed at a more general readership. The book avoids unnecessary technical detail in order to be easily accessible, and forms a comprehensive text on EMPA and SEM for geological postgraduate and postdoctoral researchers, as well as those working in industrial laboratories.
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This 2005 book forms a comprehensive text on EMPA and SEM for geological postgraduate and postdoctoral researchers, as well as those working in industrial laboratories. Throughout the book there is an emphasis on geological aspects and unnecessary technical detail is avoided in order to make the book easily accessible.
Review of the hardback: 'The subject is treated in a clear and logical fashion ... Dr Reed has produced an excellent and thoroughly readable book ... highly recommended for all those who use the electron microprobe.' Allan Pring, Geological Magazine
Review of the hardback: 'A good introductory level of information on all the main aspects of scanning electron microscopy and microanalysis that is not so readily available anywhere else. The book is well illustrated and written in a clear and readable style ... It is strongly recommended for new users and should have a place in every laboratory. It would make an excellent textbook for introductory courses.' M. T. Styles, Analyst
Review of the hardback: 'This book is a valuable introduction to the use and geological application of scanning electron microscopes and electron microprobes ... by far the most readable of the microscope/microprobe books that I have seen ... It is pitched at the right level for the market at which it is aimed, postgraduate and postdoctoral workers, or geologists in industrial laboratories ... It is a splendid book that should sit on the bookshelf of anybody working with electron microscopes and microprobes, be part of any laboratory and be required reading for any graduate student working with microbeam techniques.' Peter Treloar, Geoscientist
Review of the hardback: ' ...this is a book that has been long overdue, and will certainly go to the top of my students' reading list.' Eric Condliffe, Journal of Petrology
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Seller: Hamelyn, Madrid, M, Spain
Condition: Muy bueno. : Este libro, actualizado para cubrir los desarrollos recientes, abarca las técnicas estrechamente relacionadas del análisis de microsonda electrónica (EMPA) y la microscopía electrónica de barrido (SEM) específicamente desde un punto de vista geológico. Los temas tratados incluyen: principios de las interacciones electrón-blanco, instrumentación de haz de electrones, espectrometría de rayos X, principios generales de la formación de imágenes SEM, producción de 'mapas' de rayos X que muestran distribuciones elementales, procedimientos para el análisis cualitativo y cuantitativo de rayos X (tanto de dispersión de energía como de dispersión de longitud de onda), el uso de 'verdaderas' microsondas electrónicas y SEM equipados con espectrómetros de rayos X, y asuntos prácticos como la preparación de muestras y el tratamiento de resultados. Se hace hincapié en los aspectos geológicos no mencionados en libros similares dirigidos a un público más general. El libro evita detalles técnicos innecesarios para ser fácilmente accesible, y forma un texto actualizado sobre EMPA y SEM para investigadores geológicos de postgrado y postdoctorado, así como para aquellos que trabajan en laboratorios industriales. EAN: 9780521142304 Tipo: Libros Categoría: Ciencias Título: Electron Microprobe Analysis and Scanning Electron Microscopy in Geology Autor: S. J. B. Reed Idioma: en Páginas: 212. Seller Inventory # Happ-2026-08-04-f528f450
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