X-Parameters: Characterization, Modeling, and Design of Nonlinear RF and Microwave Components (The Cambridge RF and Microwave Engineering Series) - Hardcover

Book 11 of 20: Cambridge RF and Microwave Engineering

Root, David E.; Verspecht, Jan; Horn, Jason; Marcu, Mihai

 
9780521193238: X-Parameters: Characterization, Modeling, and Design of Nonlinear RF and Microwave Components (The Cambridge RF and Microwave Engineering Series)
Hardcover
ISBN 10: 0521193230 ISBN 13: 9780521193238
Publisher: Cambridge University Press, 2013

Synopsis

This is the definitive guide to X-parameters, written by the original inventors and developers of this powerful new paradigm for nonlinear RF and microwave components and systems. Learn how to use X-parameters to overcome intricate problems in nonlinear RF and microwave engineering. The general theory behind X-parameters is carefully and intuitively introduced, and then simplified down to specific, practical cases, providing you with useful approximations that will greatly reduce the complexity of measuring, modeling and designing for nonlinear regimes of operation. Containing real-world case studies, definitions of standard symbols and notation, detailed derivations within the appendices, and exercises with solutions, this is the definitive stand-alone reference for researchers, engineers, scientists and students looking to remain on the cutting-edge of RF and microwave engineering.

"synopsis" may belong to another edition of this title.

About the Authors

David E. Root is an Agilent Research Fellow at Agilent Technologies. He co-led the Agilent research and technical development of X-parameters through its commercialization. He is a Fellow of the IEEE and co-editor of Nonlinear Transistor Model Parameter Extraction Techniques (2011).

Jan Verspecht is a Master Research Engineer at Agilent Technologies. He invented X-parameters in 1996 and is a Fellow of the IEEE.

Jason Horn is an Expert Design Engineer at Agilent Technologies and has been heavily involved in the development of X-parameter measurements.

Mihai Marcu is a Senior Consultant at Agilent Technologies, deeply involved in the development and application of X-parameters for non-linear modeling.

"About this title" may belong to another edition of this title.

Publisher
Cambridge University Press
Publication date
2013
Language
English
ISBN 10 
0521193230
ISBN 13 
9780521193238
Binding
Hardcover
Edition number
1
Number of pages
233