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Surface Analysis of Polymers by XPS and Static SIMS (Cambridge Solid State Science Series) - Hardcover
Synopsis
This in-depth treatment of the instrumentation, physical bases and applications of x-ray photoelectron spectroscopy (XPS) and static secondary ion mass spectroscopy (SSIMS) contains a specific focus on the subject of polymeric materials. XPS and SSIMS are widely accepted as the two most powerful techniques for polymer surface chemical analysis, particularly in the context of industrial research and problem solving. The author describes the techniques and applications of XPS and SSIMS. He also includes details of case studies, emphasizing the complementary and joint application of XPS and SSIMS in the investigation of polymer surface structure and its relationship to the properties of the material. This book will be of value to academic and industrial researchers interested in polymer surfaces and surface analysis.
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Book Description
The behaviour of polymer and plastic surfaces is critical to a variety of applications of these materials, for example in printing, adhesive bonding, lamination and biomedical applications. This in turn is governed by the chemical structure and composition of the outermost molecular layers. This book describes the instrumentation, physical bases and application of two of the most powerful techniques for polymer surface chemical analysis to have emerged in the past 25 years. It brings together the present state of knowledge in one book for the first time and is written by a pioneer in the field whose research has been driven by industrial requirements.
Review
"...written by one of those that mostly contributed to the development of the field...valuable to academic and industrial researchers interested to be introduced in the field." Polymer News
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Surface Analysis of Polymers by XPS and Static SIMS (Cambridge Solid State Science Series)
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Cambridge University Press, 1998
ISBN 10: 0521352223
ISBN 13: 9780521352222
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Surface Analysis of Polymers by XPS and Static Sims
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ISBN 10: 0521352223
ISBN 13: 9780521352222
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Surface Analysis of Polymers by XPS and Static SIMS (Cambridge Solid State Science Series)
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ISBN 10: 0521352223
ISBN 13: 9780521352222
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Surface Analysis of Polymers by XPS and Static Sims
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ISBN 10: 0521352223
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Surface Analysis of Polymers by XPS and Static Sims
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ISBN 10: 0521352223
ISBN 13: 9780521352222
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Surface Analysis of Polymers by XPS and Static SIMS (Cambridge Solid State Science Series)
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Cambridge University Press, 1998
ISBN 10: 0521352223
ISBN 13: 9780521352222
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Condition: New. The book describes the development of two powerful techniques for polymer surface studies. Series Editor(s): Clarke, D. R.; Suresh, S.; Ward, I. M. Series: Cambridge Solid State Science Series. Num Pages: 214 pages, 119 b/w illus. 19 tables. BIC Classification: PNN; TG. Category: (P) Professional & Vocational. Dimension: 247 x 174 x 13. Weight in Grams: 605. . 1998. hardcover. . . . . Seller Inventory # V9780521352222
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Surface Analysis of Polymers by XPS and Static SIMS (Cambridge Solid State Science Series)
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ISBN 13: 9780521352222
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Surface Analysis of Polymers by XPS and Static Sims
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ISBN 10: 0521352223
ISBN 13: 9780521352222
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Surface Analysis of Polymers by XPS and Static Sims
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ISBN 10: 0521352223
ISBN 13: 9780521352222
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Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. The book describes the development of two powerful techniques for polymer surface studies.Inhaltsverzeichnis1. Introduction 2. X-ray photoelectron spectroscopy (XPS) 3. Information from polymer XPS 4. Static secondary ion mass sp. Seller Inventory # 446932714
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Surface Analysis of Polymers by XPS and Static SIMS (Hardcover)
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Cambridge University Press, Cambridge, 1998
ISBN 10: 0521352223
ISBN 13: 9780521352222
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Hardcover. Condition: new. Hardcover. This book provides an in-depth treatment of the instrumentation, physical bases and applications of X-ray photoelectron spectroscopy (XPS) and static secondary ion mass spectroscopy (SSIMS) with a specific focus on the subject of polymeric materials. XPS and SSIMS are widely accepted as the two most powerful techniques for polymer surface chemical analysis, particularly in the context of industrial research and problem solving. In this book, the techniques of XPS and SSIMS are described and in each case the author explains what type of information may be obtained. The book also includes details of case studies emphasising the complementary and joint application of XPS and SSIMS in the investigation of polymer surface structure and its relationship to the properties of the material. This book will be of value to academic and industrial researchers interested in polymer surfaces and surface analysis. The book describes the development of two powerful techniques for polymer surface studies. This item is printed on demand. Shipping may be from our UK warehouse or from our Australian or US warehouses, depending on stock availability. Seller Inventory # 9780521352222
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