Reflection Electron Microscopy and Spectroscopy for Surface Analysis

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9780521482660: Reflection Electron Microscopy and Spectroscopy for Surface Analysis
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This book is a comprehensive review of the theories, techniques and applications of reflection electron microscopy (REM), reflection high-energy electron diffraction (RHEED) and reflection electron energy-loss spectroscopy (REELS). The book is divided into three parts: diffraction, imaging and spectroscopy. The text is written to combine basic techniques with special applications, theories with experiments, and the basic physics with materials science, so that a full picture of RHEED and REM emerges. An entirely self-contained study, the book contains much invaluable reference material, including FORTRAN source codes for calculating crystal structures data and electron energy-loss spectra in different scattering geometries. This and many other features makes the book an important and timely addition to the materials science literature for researchers and graduate students in physics and materials science.

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Book Description:

In this book, RHEED, REM and REELS techniques are comprehensively reviewed for the first time. The text is written to combine basic techniques with special applications, theories with experiments, and the basic physics with materials science, so that a full picture of RHEED and REM emerges. The book is written for materials scientists and graduate students and is entirely self-contained. FORTRAN source codes are provided for calculating crystal structure data and electron energy-loss spectra in different scattering geometries.

Review:

'A very complete review of all work performed in reflection electron microscopy with an exhaustive bibliography ... It forms an exciting support for the understanding of surface studies by reflection electron microscopy. Illustrated by many beautiful and pertinent REM images and well-designed line drawings, this book should certainly be useful for graduate students and scientists working on surface characterization.' Andre Rocher, Measurement Science & Technology

'For those with a TEM background it represents, perhaps, the definitive text for reflection methods ... extremely readable ... attractive style ... Dr. Wang is to be congratulated on writing a very accesible text. The book is thoroughly recommended.' John F. Watts, The Analyst

' ... a very pleasing volume which should attract new users to these techniques.' P. W. Hawkes, Ultramicroscopy

' ... this book provides a comprehensive review of theory, techniques and applications of reflection electron microscopy.' Aslib Book Guide

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