Development of Methods for the Characterisation of Roughness in Three Dimensions (Report) - Softcover
From the Publisher
Development Of Methods For The Characterisation Of Roughness In Three Dimensions will be the standard work on 3-D surface characterization as it contains for the first time the basis for a unified approach to the subject, as well as for the new 3-D INTERNATIONAL STANDARD.
The book will be of immediate interest to specialists in Micro Instrumentation, Precision Engineering Practitioners and Academics, to Mechanical, Quality Assurance and Production Engineers, and to Metrology Researchers, Standards Institutes, Metrology Manufacturing Companies and Metrology Software Companies.
This is an updated version of a noted previous publication, that has tradidionally been very difficult to get hold of. It is essentially the "Bible" of the subject of 3-D surface characterization. Practitioners in this or related fields would consider this book a standard text.
About the Author
Professor Liam Blunt is Taylor Hobson Professor of Surface Metrology at the University of Huddersfield, UK. He is author of numerous published papers and other contributions on surface technology, and is co-author with Ken Stout of Three Dimensional Surface Topography (published by Penton Press, 2000).
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