Digital Systems Testing and Testable Design (Electrical Engineering, Communications, and Signal Processin)

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9780716781790: Digital Systems Testing and Testable Design (Electrical Engineering, Communications, and Signal Processin)
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For many years, Breuer-Friedman's Diagnosis and Reliable Design ofDigital Systems was the most widely used textbook in digital system testing and testable design. Now, Computer Science Press makes available a new and greativ expanded edition. Incorporating a significant amount of new material related to recently developed technologies, the new edition offers comprehensive and state-ofthe-art treatment of both testing and testable design.

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From the Back Cover:

This widely-used textbook provides comprehensive, state-of-the-art coverage of digital systems testing and testable design.

Considered a definitive text in this area, the book includes in-depth discussions of the following topics:

Test generation
Fault modeling for classic and new technologies
Simulation
Fault simulation
Design for testability
Built-in self-test Diagnosis

All topics are covered extensively, from fundamental concepts to advanced techniques.

Successfully used world-wide at leading universities, the book is appropriate for graduate-level and senior-level undergraduate courses. Numerous examples and problems help make the learning process easier for the reader. Test engineers, ASIC and system designers, and CAD developers will find it an invaluable tool to keep current with recent changes in the field.

About the Author:

Miron Abramovici is a Distinguished Member of the Technical Staff at AT&T Bell Laboratories in Murray Hill, and an Adjunct Professor of Computer Engineering at the Illinois Institute of Technology in Chicago.

Melvin A. Breuer is a Professor of Electrical Engineering and Computer Science at the University of Southern California in Los Angeles.

Arthur D. Friedman is a Professor in the Department of Electrical Engineering and Computer Science at George Washington University.
All three authors are Fellows of the IEEE and have contributed extensively to the fields discussed in this book.

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Other Popular Editions of the Same Title

9780780310629: Digital Systems Testing & Testable Design

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ISBN 10:  0780310624 ISBN 13:  9780780310629
Publisher: Wiley-IEEE Press, 1994
Hardcover

9780780310544: Digital Systems Testing and Testable Design

Instit..., 1994
Hardcover

9788172248918: Digital Systems Testing and Testable Design

Jaico ..., 2006
Softcover

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