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Computed Electron Micrographs and Defect Identification (Defects in Crystalline Solids)
Published by
North-Holland Publishing Company, 1973
ISBN 10: 0720417570
ISBN 13: 9780720417579
Used
Hardcover
Seller: MB Books, Derbyshire, United Kingdom
Seller rating 5 out of 5 stars
Hardcover. Condition: Good. No Jacket. Condition : Good. Hard cover, no jacket. Former university library copy with associated markings. 400pp. No annotations or highlighting. Covered in protective laminate. Minor shelf wear. Photo on request. Seller Inventory # 943313
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US$ 19.22
US$ 29.32 shipping
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Ships from United Kingdom to U.S.A.
Quantity: 1 available
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Computed Electron Micrographs and Defect Identification
Published by
North Holland, Amsterdam, 1973
ISBN 10: 0720417570
ISBN 13: 9780720417579
Used
Hardcover
First Edition
Seller: Webbooks, Wigtown, Wigtown, United Kingdom
Seller rating 5 out of 5 stars
Hard Cover. Condition: Good. No Jacket. First edition. From an academic library with the usual stamps etc. Seller Inventory # PF3875
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US$ 10.98
US$ 39.99 shipping
Ships from United Kingdom to U.S.A.
Ships from United Kingdom to U.S.A.
Quantity: 1 available