All papers in this volume were peer reviewed by two reviewers for each paper. This volume describes recent developments in thermometry, process control, and related materials properties. Topics covered include: temperature standards; characterization and development of both common and novel thermometer types; uncertainties and calibration methods; results of recent international comparisons; hardware and methods for temperature control; and applications in the semiconductor and metal processing industries.
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Book Description American Inst. of Physics. Hardcover. Book Condition: VERY GOOD. Light rubbing wear to cover, spine and page edges. Very minimal writing or notations in margins not affecting the text. Possible clean ex-library copy, with their stickers and or stamp(s). Bookseller Inventory # 2809666747