The EMMM-2007 Conference brought together leading experts in electron microscopy and materials modeling from around the world to explore how to synergistically combine atomic scale characterization and modeling to enhance the development of new materials.
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Condition: Sehr gut. Zustand: Sehr gut | Seiten: 300 | Sprache: Englisch | Produktart: Bücher | Keine Beschreibung verfügbar. Seller Inventory # 4358214/12
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