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International Conference on Advanced Phase Measurement Methods in Optics and Imaging (AIP Conference Proceedings, 1236) - Softcover
Synopsis
Phase plays an important role in the various branches of optics and imaging and in different wavelength ranges from x-ray to millimetre-waves. The key topics of the conference are therefore phase control and advanced phase measurements to stimulate discussion among different branches of metrology.
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International Conference on Advanced Phase Measurement Methods in Optics and Imaging: Monte Verita, Ascona, Switzerland, 16-21 May 2010
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Condition: Sehr gut. Zustand: Sehr gut | Seiten: 494 | Sprache: Englisch | Produktart: Bücher | Keine Beschreibung verfügbar. Seller Inventory # 7684806/12
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International Edition
INTERNATIONAL CONFERENCE ON ADVANCED PHASE MEASUREMENT METHODS IN OPTICS AND IMAGING (PB 2010)
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AMERICAN INSTITUTE OF PHYSICS, 2010
ISBN 10: 0735407835
ISBN 13: 9780735407831
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