Electron Microscopy and Analysis, Third Edition - Softcover

Peter J. Goodhew; John Humphreys; Richard Beanland

Softcover

ISBN 10: 0748409688 ISBN 13: 9780748409686

Publisher: Crc Press, 2000

Synopsis

Electron Microscopy and Analysis deals with several sophisticated techniques for magnifying images of very small objects by large amounts - especially in a physical science context. It has been ten years since the last edition of Electron Microscopy and Analysis was published and there have been rapid changes in this field since then. The authors have vastly updated their very successful second edition, which is already established as an essential laboratory manual worldwide, and they have incorporated questions and answers in each chapter for ease of learning. Equally as relevant for material scientists and bioscientists, this third edition is an essential textbook.

About this title

About the Author:

Peter J. Goodhew is a materials scientist who has worked with Electron Microscopes for 35 years at the University of Surrey, Cornell University and The University of Liverpool. He has written more than 200 papers on the applications of Electron Microscopes in metallurgy and semiconductor science. He is currently the Henry Bell Wortley, Professor of Materials Engineering at The University of Liverpool

About this edition

• Publisher: Crc Press
• Publication date: 2000
• ISBN 10: 0748409688
• ISBN 13: 9780748409686
• Binding: Paperback
• Edition number: 3
• Number of pages: 264