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This volume continues the tradition of previous meetings in the series and provides researchers with an overview of recent developments in the field. Contains invited review papers together with in-depth coverage of the latest research results. Encompassing techniques from transmission and scanning electron microscopy, X-ray topography and diffraction, scanning probe microscopy and atom probe microanalysis, as applied to the whole range of semiconducting materials.
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Book Description CRC Press, 1996. Condition: Very Good. 1st Edition. Ships from the UK. Former Library book. Great condition for a used book! Minimal wear. Seller Inventory # GRP99111034
Book Description CRC Press. Condition: Good. Ex-library, so some stamps and wear, but in good overall condition. Seller Inventory # Z1-G-021-00806
Book Description Institute of Physics Publishing, 1995. Condition: As New. No Jacket. First Edition. Proceedings of the institute of physics conference held at Oxford University 20-23 March 1995. Slick gray hardcover binding, no DJ. Looks like a new copy. Seller Inventory # 024364
Book Description Institute of Physics Publishing, United Kingdom, 1995. Hard Cover. Condition: As New. No Jacket. First Edition. Previous owner's name, otherwise a fine copy of proceedings of the institute of physics conference held at Oxford University 20-23 March, 1995. Dark gray binding in a gray mylar protected DJ. MEDIA SHIPPING ONLY. Seller Inventory # 051898
Book Description CRC Press, 1996. Hardcover. Condition: Good. 1. Ships with Tracking Number! INTERNATIONAL WORLDWIDE Shipping available. May not contain Access Codes or Supplements. May be ex-library. Shipping & Handling by region. Buy with confidence, excellent customer service!. Seller Inventory # 0750303476
Book Description Institute of Physics Publishing, 1995. Hardcover. Condition: As New. As New. book. Seller Inventory # F5S5-6-Z-0750303476-5