Physical Methods for Materials Characterisation, Second Edition (Series in Materials Science and Engineering)

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9780750308083: Physical Methods for Materials Characterisation, Second Edition (Series in Materials Science and Engineering)

In the second edition of this popular text, the authors provide a comprehensive description of the range of techniques currently used for characterizing the microstructure of materials. Introductory chapters cover the basic physics required to describe the microstructure of materials and their interaction with various types of radiation. Much of the hardware involved in these techniques is dependent on a vacuum environment, so a full chapter is devoted to this topic. Characterization techniques are then divided on the basis of the interrogating radiation, with separate chapters dealing with optical and x-ray techniques, electron microscopy and spectroscopy, and ion and particle microscopy and spectroscopy. Within each chapter, material is given covering the radiation sources, the construction and layout of instrumentation and the analysis of data.

Comprehensively revised throughout, this edition reflects the rapid changes that have taken place recently. It contains additional material on a range of methods, including scanning probe techniques that reflect the need for analysis of materials at the nanoscale, and a detailed review of recent developments in data analysis and computing techniques.

Physical Methods for Materials Characterisation, Second Edition will be of interest to advanced undergraduates, postgraduates, and researchers in physics, materials science, and engineering.

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About the Author:

Flewitt, Magnox Electric, UK.

Wild, University of Bristol, UK.

Review:

Reviews of the First Edition "In this book, Flewitt and Wild strike a commendable balance between comprehensiveness and depth... It will also make an excellent source book for undergraduate projects in the final year... deserves to be found in every library that serves those who characterize inorganic materials." -- Physics World "Each of the sections is well provided with references to the original literature. The book provides an excellent first port of call for anyone who needs to pick up background on these techniques." ..."a very useful book that is worth a place on the bookshelf of anyone working in the field of materials characterisation." -- Prof R Tilley MIMMM Materials World, July 2004 "The concept of this book is to bring under one title all the different techniques that can be used in the analyses and characterisation of materials. The book does not, nor does it claim to, go into great detail on any of the subjects discussed. It thereby gives a very good overview of each technique as it is described, without swamping the reader with too much detail that might hinder initial comprehension. I found the layout of the book well conceived, making it easy for the reader to quickly flip back and forth between the chapters for a reminder of certain concepts, or for a fuller description of a technique including references to other definitive works. I will recommend this book to any beginning post-graduate student student wishing to know more about materials characterisation." -- Dr Adam J. Papworth, Dept of Engineering, The University of Liverpool.

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Peter E. J. Flewitt, R. K. Wild
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Book Description Taylor Francis Ltd, United Kingdom, 2004. Mixed media product. Book Condition: New. 2nd Revised edition. Language: English . Brand New Book. In the second edition of this popular text, the authors provide a comprehensive description of the range of techniques currently used for characterizing the microstructure of materials. Introductory chapters cover the basic physics required to describe the microstructure of materials and their interaction with various types of radiation. Much of the hardware involved in these techniques is dependent on a vacuum environment, so a full chapter is devoted to this topic. Characterization techniques are then divided on the basis of the interrogating radiation, with separate chapters dealing with optical and x-ray techniques, electron microscopy and spectroscopy, and ion and particle microscopy and spectroscopy. Within each chapter, material is given covering the radiation sources, the construction and layout of instrumentation and the analysis of data. Comprehensively revised throughout, this edition reflects the rapid changes that have taken place recently. It contains additional material on a range of methods, including scanning probe techniques that reflect the need for analysis of materials at the nanoscale, and a detailed review of recent developments in data analysis and computing techniques. Physical Methods for Materials Characterisation, Second Edition will be of interest to advanced undergraduates, postgraduates, and researchers in physics, materials science, and engineering. Bookseller Inventory # AA69780750308083

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Book Description Taylor Francis Ltd, United Kingdom, 2004. Mixed media product. Book Condition: New. 2nd Revised edition. Language: English . Brand New Book. In the second edition of this popular text, the authors provide a comprehensive description of the range of techniques currently used for characterizing the microstructure of materials. Introductory chapters cover the basic physics required to describe the microstructure of materials and their interaction with various types of radiation. Much of the hardware involved in these techniques is dependent on a vacuum environment, so a full chapter is devoted to this topic. Characterization techniques are then divided on the basis of the interrogating radiation, with separate chapters dealing with optical and x-ray techniques, electron microscopy and spectroscopy, and ion and particle microscopy and spectroscopy. Within each chapter, material is given covering the radiation sources, the construction and layout of instrumentation and the analysis of data. Comprehensively revised throughout, this edition reflects the rapid changes that have taken place recently. It contains additional material on a range of methods, including scanning probe techniques that reflect the need for analysis of materials at the nanoscale, and a detailed review of recent developments in data analysis and computing techniques. Physical Methods for Materials Characterisation, Second Edition will be of interest to advanced undergraduates, postgraduates, and researchers in physics, materials science, and engineering. Bookseller Inventory # AA69780750308083

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