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Synopsis
Principles of Semiconductor Network Testing gathers together comprehensive information which test and process professionals will find invaluable. The techniques outlined will help ensure that test methods and data collected reflect actual device performance, rather than 'testing the tester' or being lost in the noise floor.
This book addresses the fundamental issues underlying the semiconductor test discipline. The test engineer must understand the basic principles of semiconductor fabrication and process and have an in-depth knowledge of circuit functions, instrumentation and noise sources.
- Introduces a novel component-testing philosophy for semiconductor test, product and design engineers
- Best new source of information for experienced semiconductor engineers as well as entry-level personnel
- Eight chapters about semiconductor testing
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About the Author
National Semiconductor
"About this title" may belong to another edition of this title.
- PublisherNewnes
- Publication date1995
- ISBN 10 0750694726
- ISBN 13 9780750694728
- BindingHardcover
- LanguageEnglish
- Edition number1
- Number of pages350
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Principles of Semiconductor Network Testing
Seller: Southampton Books, Sag Harbor, NY, U.S.A.
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Hardcover. Condition: Like New. First Edition. First Edition, First Printing. Published by Butterworth-Heinemann, 1995. Octavo. Book is like new. 30 day money back guarantee. NEXT DAY SHIPPING! Excellent customer service. Please email with any questions or if you would like a photo. All books packed carefully and ship with free delivery confirmation/tracking. All books come with free bookmarks. Ships from Sag Harbor, New York. Seller Inventory # 178901
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Principles of Semiconductor Network Testing
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Woburn, Massachusetts, U.S.A.: Newnes, 1995
ISBN 10: 0750694726
ISBN 13: 9780750694728
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Seller: Bingo Used Books, Vancouver, WA, U.S.A.
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Hardcover. Condition: Near Fine. Hardback in near fine condition. Seller Inventory # 149699
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Principles of Semiconductor Network Testing (Test & Measurement)
Seller: HPB-Red, Dallas, TX, U.S.A.
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Hardcover. Condition: Good. Connecting readers with great books since 1972! Used textbooks may not include companion materials such as access codes, etc. May have some wear or writing/highlighting. We ship orders daily and Customer Service is our top priority! Seller Inventory # S_386641020
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Principles of Semiconductor Network Testing (Test & Measurement)
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Boston, MA: U.S.A.: Newnes / Butterworth Heinemann, 1995
ISBN 10: 0750694726
ISBN 13: 9780750694728
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Hardcover
First Edition
Seller: The Warm Springs Book Company, Fremont, CA, U.S.A.
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Hardcover. Condition: Fine. No Jacket. 1st Edition. A fine copy in pictorial boards issued w/o a DJ. 1st edition with complete number line. Illustrated; Contents: Preface; Diode and transistor operation; Integrated circuit test basics; Digital logic test; Noise identification; Operational amplifier general information; Data acquisition devices; Digital signal processing; CODEC (Coder/Decoder); References. 8vo., 213 pages. Seller Inventory # 25028
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Principles of Semiconductor Network Testing
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Principles of Semiconductor Network Testing (Test & Measurement)
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hardcover. Condition: New. In shrink wrap. Looks like an interesting title! Seller Inventory # Q-0750694726
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