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Synopsis
The proceedings of the 21st IEEE VLSI test symposium (VTS (2003) describing innovations in the testing of integrated circuits and systems.
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VLSI Test Symposium (Vts 2003)
Published by
Institute of Electrical & Electronics Engineers(IEEE), 2003
ISBN 10: 0769519245
ISBN 13: 9780769519241
Used
Softcover
Seller: Goodwill of Silicon Valley, SAN JOSE, CA, U.S.A.
Seller rating 4 out of 5 stars
Condition: good. Supports Goodwill of Silicon Valley job training programs. The cover and pages are in Good condition! Any other included accessories are also in Good condition showing use. Use can include some highlighting and writing, page and cover creases as well as other types visible wear. Seller Inventory # GWSVV.0769519245.G
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