Measurement Theory and System Characterization; Metrology; Standards and Calibration; Quantization and A/D Conversion; Basic Measurements; High Frequency and Dielectric Measurements; Optoelectronic Measurements; Sensors and Their Interfaces; Smart Sensor Integration Technologies; Data Acquisition and Computer Based Measurement Systems; Signal Processing; Image Processing; General Applications; Integrated Circuit Testing; Soft Computing
"synopsis" may belong to another edition of this title.
Seller: Zubal-Books, Since 1961, Cleveland, OH, U.S.A.
Condition: Good. *FREE DOMESTIC SHIPPING until Monday, Nov. 24* 521 pp., Hardcover, ex library, else text and binding clean and tight. - If you are reading this, this item is actually (physically) in our stock and ready for shipment once ordered. We are not bookjackers. Buyer is responsible for any additional duties, taxes, or fees required by recipient's country. Seller Inventory # ZB1103322
Seller: Wonder Book, Frederick, MD, U.S.A.
Condition: Good. Good condition. A copy that has been read but remains intact. May contain markings such as bookplates, stamps, limited notes and highlighting, or a few light stains. Bundled media such as CDs, DVDs, floppy disks or access codes may not be included. NOT AVAILABLE FOR SHIPMENT OUTSIDE OF THE UNITED STATES. Seller Inventory # Q12B-01298
Seller: Buchpark, Trebbin, Germany
Condition: Sehr gut. Zustand: Sehr gut | Sprache: Englisch | Produktart: Bücher. Seller Inventory # 41869953/202