Characterization of Semiconductor Materials, Volume 1: Principles and Methods (Volume 1) - Hardcover
Synopsis
Characterization of semiconductor materials and methods used to characterize them will be described extensively in this new Noyes series. Written by experts in each subject area, the series will present the most up-to-date information available in this rapidly advancing field. Includes chapters on Electrical Characterization, Ion Mass Spectrometry, Photoelectron Spectroscopy, Ion/Solid Interactions and more.
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Characterization of Semiconductor Materials, Volume 1 : Principles and Methods
Published by
Elsevier Science & Technology Books, 1989
ISBN 10: 0815512007
ISBN 13: 9780815512004
Used
Hardcover
Seller: Better World Books: West, Reno, NV, U.S.A.
Seller rating 5 out of 5 stars
Condition: Good. Pages intact with minimal writing/highlighting. The binding may be loose and creased. Dust jackets/supplements are not included. Stock photo provided. Product includes identifying sticker. Better World Books: Buy Books. Do Good. Seller Inventory # 57585211-75