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Synopsis
Contains 32 papers and a speech from the October 1994 workshop. Topics of discussion include fault tolerance architectures, testable architectures, yield and defect models, laser processes for defect correction, self-checking and coding techniques, fault-tolerant techniques, yield enhancement, reconfiguration in 3D meshes, and testing techniques. Lacks an index. Annotation copyright Book News, Inc. Portland, Or.
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The IEEE International Workshop on Defect And Fault Tolerance in Vlsi Systems
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