Tutorial: Test Generation for Vlsi Chips

ISBN 13: 9780818687860

Tutorial: Test Generation for Vlsi Chips

0 avg rating
( 0 ratings by Goodreads )
 
9780818687860: Tutorial: Test Generation for Vlsi Chips
View all copies of this ISBN edition:
 
 

Reprints of papers taken from 18 different journals, published between 1967 and 1987. They give a comprehensive overview of very large-scale integration testing. No significant prior experience in testing is assumed. Concepts and current practices are emphasized. Chapters are preceded by a tutorial. Graphs and illustrations are featured in most pages. Topics include fault modeling, test generation, test evaluation, testability analysis, design for testability, and automatic test equipment. Annotation copyright Book News, Inc. Portland, Or.

"synopsis" may belong to another edition of this title.

Buy New View Book
List Price: US$ 30.00
US$ 81.61

Convert Currency

Shipping: US$ 4.99
Within U.S.A.

Destination, Rates & Speeds

Add to Basket

Top Search Results from the AbeBooks Marketplace

1.

Vishwani D. Agrawal (Editor), Sharad C. Seth (Editor)
Published by Ieee Computer Society (1988)
ISBN 10: 081868786X ISBN 13: 9780818687860
New Hardcover Quantity Available: 1
Seller:
Ergodebooks
(RICHMOND, TX, U.S.A.)
Rating
[?]

Book Description Ieee Computer Society, 1988. Hardcover. Condition: New. Seller Inventory # DADAX081868786X

More Information About This Seller | Contact this Seller

Buy New
US$ 81.61
Convert Currency

Add to Basket

Shipping: US$ 4.99
Within U.S.A.
Destination, Rates & Speeds