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Synopsis
Reprints of papers taken from 18 different journals, published between 1967 and 1987. They give a comprehensive overview of very large-scale integration testing. No significant prior experience in testing is assumed. Concepts and current practices are emphasized. Chapters are preceded by a tutorial. Graphs and illustrations are featured in most pages. Topics include fault modeling, test generation, test evaluation, testability analysis, design for testability, and automatic test equipment. Annotation copyright Book News, Inc. Portland, Or.
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- PublisherIEEE Computer Society
- Publication date1988
- ISBN 10 081868786X
- ISBN 13 9780818687860
- BindingHardcover
- LanguageEnglish
- Number of pages401
- EditorAgrawal Vishwani D., Seth Sharad C.
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Tutorial: Test Generation for Vlsi Chips
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Tutorial: Test Generation for Vlsi Chips
Published by
IEEE Computer Society Press,U.S., 1988
ISBN 10: 081868786X
ISBN 13: 9780818687860
Used
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