Synopsis
This volume covers topics yield and defect density; reliability enhancement; defect and fault analysis; testing techniques; fault diagnosis; fault-tolerant designs; high-level synthesis of reliable systems; and yield and reliability issues of analogue and mixed signal circuits.
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1998 International Symposium on Defect and Fault Tolerance in VLSI Systems, Proceedings.
ISBN 10: 0818688327
ISBN 13: 9780818688324
Used
Softcover
First Edition
Seller: Alien Bindings, BALTIMORE, MD, U.S.A.
Seller rating 5 out of 5 stars
Softcover. Condition: Very Good. No Jacket. First Edition. Ex research library book. The rear cover is lightly scuffed. The binding is tight. The interior pages are clean and unmarked. Electronic delivery tracking will be issued free of charge. Seller Inventory # 09052