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Selected Papers on Interference, Interferometry, and Interferometric Metrology (Spie Milestone Series) - Hardcover
Contents
- Interference
- Quantum Effects
- Two-Beam and Multiple-Beam Interferometers
- Laser Interferometers
- Interferometric Optical Testing
- Interferogram Analysis
- Interference Microscopy and Surface Profiling
- Interferometric Sensors
- Nonlinear and Phase Conjugate Interferometers
- Interference Spectroscopy, Measurement of Laser Wavelengths and Frequencies
- Industrial Applications
"synopsis" may belong to another edition of this title.
- PublisherSPIE--The International Society for Optical Engineering
- Publication date1995
- ISBN 10 0819419362
- ISBN 13 9780819419361
- BindingHardcover
- Number of pages718
- EditorParameswaran Hariharan, Daniel Malacara-Hernandez
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Selected Papers on Interference, Interferometry, and Interferometric Metrology (SPIE Milestone Series, Volume MS 110)
Published by
SPIE Optical Engineering Press, Bellingham, WA
(1995)
ISBN 10: 0819419362
ISBN 13: 9780819419361
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Hardcover
First Edition
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Book Description Hard Cover. Condition: Near Fine. No Jacket. First Edition. Lightly bumped with a few check marks next to articles in the table of contents. Bindind square and solid, 701 pages. Size: 4to - over 9¾" - 12" tall. Seller Inventory # C220001
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