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Design & Test Techniques for VLSI & WSI Circuits
Published by
Peter Peregrinus Ltd, London, 1989
ISBN 10: 0863411657
ISBN 13: 9780863411656
Used
Hardcover
First Edition
Seller: A & I PEDERSEN, Macclesfield, CHS, United Kingdom
Seller rating 5 out of 5 stars
Hard Cover. First Edition. Hard cloth covers, ex college library copy with internal labels and stamp, no pocket, otherwise a fine copy, pp vi,315. Text illustrations, tables and diagrams throughout. Published on behalf of the Institution of Electrical Engineers. Size: 15x23cm. Seller Inventory # 005156
Quantity: 1 available
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Design and Test Techniques for Very Large Scale Integration and Wafer Scale Integration (IEE computing series)
Published by
Institution of Engineering and Technology, 1989
ISBN 10: 0863411657
ISBN 13: 9780863411656
Used
Hardcover
Seller: WeBuyBooks, Rossendale, LANCS, United Kingdom
Seller rating 5 out of 5 stars
Condition: Good. Most items will be dispatched the same or the next working day. A copy that has been read but remains in clean condition. All of the pages are intact and the cover is intact and the spine may show signs of wear. The book may have minor markings which are not specifically mentioned. Seller Inventory # wbs8138553541
Quantity: 1 available
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Design and Test Techniques for Vlsi and Wsi Circuits (Computing Series No 15)
Published by
Inst of Engineering & Technology, 1989
ISBN 10: 0863411657
ISBN 13: 9780863411656
New
Hardcover
Seller: StainesBook, Weybridge, SURRE, United Kingdom
Seller rating 1 out of 5 stars
Seller Inventory # SpeedList-4210
Quantity: 4 available