Halt, Hass, and Hasa Explained: Accelerated Reliability Techniques - Hardcover

McLean, Harry W.

Hardcover

ISBN 10: 0873894898 ISBN 13: 9780873894890

Publisher: Asq Pr, 2000

Synopsis

Highly Accelerated Life Test (HALT), Highly Accelerated Test Screen (HASS), and Highly Accelerated Stress Audit (HASA) are methods used by manufacturers to expose products to extreme environmental conditions, improve their design, eliminate process weakness, and improve product quality. McLean (reliability engineering manager, AT&T Wireless Services) explains how to develop accelerated reliability programs using these techniques. Annotation c. Book News, Inc., Portland, OR (booknews.com)

About this title

About the Author

Harry W. McLean is currently employed as a Reliability Engineering Manager at AT&T Wireless Services in Redmond, Washington. He has completed, throughout his career, over 150 HALTs in Medical, Avionics, Telecom, Automotive, Storage Devices and Information Technology equipment throughout North and South America. Hewlett-Packard employed Harry for twenty-five years, and during his career he held various positions in production, research and development, and quality and reliability engineering. While at HP he helped the company move beyond the use of traditional environmental and qualification methods to HALT and HASS, and designed and implemented the HASA process that is included in this book. Following his time with HP McLean was employed with QualMark where he consulted with many companies in the successful application of HALT and HASS, was the project research and development manager, and also taught HALT and HASS seminars. McLean received his electrical engineering degree from Northeastern University in Boston, MA.

Edition details

• Publisher: Asq Pr
• Publication date: 2000
• Language: English
• ISBN 10: 0873894898
• ISBN 13: 9780873894890
• Binding: Hardcover
• Number of pages: 152