Microelectronic Reliability, Vol. 1: Reliability, Test and Diagnostics (Artech House Materials Science Library) (English and Italian Edition) - Hardcover

Hakim, Edward B

 
9780890062845: Microelectronic Reliability, Vol. 1: Reliability, Test and Diagnostics (Artech House Materials Science Library) (English and Italian Edition)

Synopsis

Text/reference spaning the theoretical concepts of reliability models and failure distributions, to GaAs microcircuit processing and test. Provides background on the development of quality assurance and verification procedures. Some of the new changes under development to cope with pressures brought

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About the Author

Hakim, U.S. Army LABCOM, Fort Monmouth, New Jersey.

Hakim, U.S. Army LABCOM, Fort Monmouth, New Jersey.

Hakim, U.S. Army LABCOM, Fort Monmouth, New Jersey.

Language Notes

Text: English, Italian (translation)

"About this title" may belong to another edition of this title.