Text/reference spaning the theoretical concepts of reliability models and failure distributions, to GaAs microcircuit processing and test. Provides background on the development of quality assurance and verification procedures. Some of the new changes under development to cope with pressures brought
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Hakim, U.S. Army LABCOM, Fort Monmouth, New Jersey.
Hakim, U.S. Army LABCOM, Fort Monmouth, New Jersey.
Hakim, U.S. Army LABCOM, Fort Monmouth, New Jersey.
Text: English, Italian (translation)
"About this title" may belong to another edition of this title.
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